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4 Nov 2002

Volume 81, Issue 19, pp. 3519-3685

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Transient photoinduced diffractive solid immersion lens for infrared microscopy

K. Cohn, D. Simanovskii, T. Smith, and D. Palanker

Appl. Phys. Lett. 81, 3678 (2002); http://dx.doi.org/10.1063/1.1519729 (3 pages) | Cited 1 time

Online Publication Date: 28 October 2002

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We present a scanning near-field infrared microscopy technique using transient solid immersion lenses as near-field probes. The transient SILs were formed by photoinducing a zone plate structure on the surfaces of semiconductor wafers with high indices of refraction. Lenses with different number of zones have been tested using gallium phosphide and silicon wafers and their focusing properties were determined. We demonstrate that transient SILs can have lifetimes longer than 50 ps and provide the same high numerical apertures as conventional SILs. The use of transient SILs eliminates the need for mechanical scanning of the lens or sample, thus providing much faster scanning and the possibility to work with soft and liquid objects. © 2002 American Institute of Physics.
Show PACS
07.79.Fc Near-field scanning optical microscopes
42.79.Bh Lenses, prisms and mirrors
42.79.Ci Filters, zone plates, and polarizers
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