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25 Nov 2002

Volume 81, Issue 22, pp. 4103-4293

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Thickness dependence on the thermal stability of silver thin films

H. C. Kim, T. L. Alford, and D. R. Allee

Appl. Phys. Lett. 81, 4287 (2002); http://dx.doi.org/10.1063/1.1525070 (3 pages) | Cited 44 times

Online Publication Date: 19 November 2002

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This study investigates the dependence of Ag resistivity on film thickness during temperature ramping as a means to access thermal stability. In situ van der Pauw four-point probe analysis is used to determine the onset temperature; the temperature when the electrical resistivity deviates from linearity during the temperature ramp. At that point, the silver thin films become unstable due to void formation and growth during thermal annealing. The thermal stability of Ag thin films on SiO2 in a vacuum is greatest when thicknesses are greater than 85 nm. Using an Arrhenius relation in terms of onset temperature and film thickness, an activation energy (0.32±0.02 eV) for the onset of agglomeration in Ag thin films on SiO2 ramped at a rate of 0.1 °C/s is determined. This value is consistent with the activation energy for surface diffusion of silver in a vacuum, which is believed to be the dominant mechanism for agglomeration of silver thin film. © 2002 American Institute of Physics.
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68.60.Dv Thermal stability; thermal effects
68.55.-a Thin film structure and morphology
73.61.At Metal and metallic alloys
68.35.Fx Diffusion; interface formation
68.55.Ln Defects and impurities: doping, implantation, distribution, concentration, etc.
61.72.Qq Microscopic defects (voids, inclusions, etc.)

A simple neutron microscope using a compound refractive lens

H. R. Beguiristain, I. S. Anderson, C. D. Dewhurst, M. A. Piestrup, J. T. Cremer, and R. H. Pantell

Appl. Phys. Lett. 81, 4290 (2002); http://dx.doi.org/10.1063/1.1524698 (3 pages) | Cited 8 times

Online Publication Date: 19 November 2002

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Images obtained with a high-magnification simple neutron microscope using a compound refractive lens are presented in this letter. The short focal length of the stack of Al biconcave lenses facilitated the setup of a simple neutron microscope at the D22 small angle scattering beam line at the Institut Laue Langevin, Grenoble, France that achieved a 35× magnification and a 214 μm resolution. Higher-resolution images could be obtained using improved neutron lens systems that enhance beam delivery from neutron sources and produce high-quality images in combination with higher resolution two-dimensional neutron detectors. © 2002 American Institute of Physics.
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07.90.+c Other topics in instruments, apparatus, and components common to several branches of physics and astronomy (restricted to new topics in section 07)
41.85.-p Beam optics
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