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19 Aug 2002

Volume 81, Issue 8, pp. 1369-1534

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Modulation of x-ray line intensity emitted by a periodic structure under electron excitation

P. Jonnard, J.-M. Ândré, C. Bonnelle, F. Bridou, and B. Pardo

Appl. Phys. Lett. 81, 1524 (2002); http://dx.doi.org/10.1063/1.1502189 (3 pages) | Cited 2 times

Online Publication Date: 9 August 2002

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We report on the intensity modulation of a characteristic x-ray line emitted by a periodic structure, as a function of the observation angle. This intensity variation takes place around the Bragg direction corresponding to the diffraction of the x-ray line by the emitting structure. An enhancement of the emitted radiation is observed and interpreted on the basis of the reciprocity theorem. The enhancement remains unchanged by varying the number of emitting periods. Following Yariv and Yeh [J. Opt. Soc. Am. 67, 438 (1977)], a possible application as x-ray resonator to achieve a distributed feedback soft x-ray laser is envisaged. © 2002 American Institute of Physics.
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42.60.Fc Modulation, tuning, and mode locking
78.70.En X-ray emission spectra and fluorescence
78.66.Db Elemental semiconductors and insulators
42.79.Wc Optical coatings

Nanotomography based on hard x-ray microscopy with refractive lenses

C. G. Schroer, J. Meyer, M. Kuhlmann, B. Benner, T. F. Günzler, B. Lengeler, C. Rau, T. Weitkamp, A. Snigirev, and I. Snigireva

Appl. Phys. Lett. 81, 1527 (2002); http://dx.doi.org/10.1063/1.1501451 (3 pages) | Cited 24 times

Online Publication Date: 9 August 2002

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Based on parabolic refractive x-ray lenses we have built a hard x-ray microscope that allows one to image the interior of opaque samples with submicrometer resolution. We have combined magnified imaging with tomography to obtain the three-dimensional structure of the sample at a resolution well below 1 μm. Using an aluminum lens to record a magnified tomogram of a test sample (microprocessor), a resolution of slightly above 400 nm was found for the three-dimensional reconstruction. Lenses made of beryllium are expected to improve this resolution to well below 100 nm. The resulting challenges concerning instrumentation and numerical methods are discussed. © 2002 American Institute of Physics.
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41.50.+h X-ray beams and x-ray optics
07.85.Tt X-ray microscopes
42.79.Bh Lenses, prisms and mirrors
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