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10 Mar 2003

Volume 82, Issue 10, pp. 1497-1639

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Appl. Phys. Lett. 82, 1610 (2003); http://dx.doi.org/10.1063/1.1559439 (3 pages)

Yong Chen, Douglas A. A. Ohlberg, Xuema Li, Duncan R. Stewart, R. Stanley Williams, Jan O. Jeppesen, Kent A. Nielsen, J. Fraser Stoddart, Deirdre L. Olynick, and Erik Anderson
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Measurement of highly transient electrical charging following high-intensity laser–solid interaction

M. Borghesi, L. Romagnani, A. Schiavi, D. H. Campbell, M. G. Haines, O. Willi, A. J. Mackinnon, M. Galimberti, L. Gizzi, R. J. Clarke, and S. Hawkes

Appl. Phys. Lett. 82, 1529 (2003); http://dx.doi.org/10.1063/1.1560554 (3 pages) | Cited 31 times

Online Publication Date: 4 March 2003

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The multi-million-electron-volt proton beams accelerated during high-intensity laser–solid interactions have been used as a particle probe to investigate the electric charging of microscopic targets laser-irradiated at intensity ∼ 1019 W cm2. The charge-up, detected via the proton deflection with high temporal and spatial resolution, is due to the escape of energetic electrons generated during the interaction. The analysis of the data is supported by three-dimensional tracing of the proton trajectories. © 2003 American Institute of Physics.
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73.40.-c Electronic transport in interface structures
61.80.Ba Ultraviolet, visible, and infrared radiation effects (including laser radiation)
79.20.Ds Laser-beam impact phenomena
41.75.Ak Positive-ion beams
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