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14 Apr 2003

Volume 82, Issue 15, pp. 2371-2540

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Appl. Phys. Lett. 82, 2491 (2003); http://dx.doi.org/10.1063/1.1566791 (3 pages)

Jun Li, Qi Ye, Alan Cassell, Hou Tee Ng, Ramsey Stevens, Jie Han, and M. Meyyappan
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Theoretical verification of the backward displacement of waves reflected from an interface having superimposed periodicity

Nico F. Declercq, Joris Degrieck, Rudy Briers, and Oswald Leroy

Appl. Phys. Lett. 82, 2533 (2003); http://dx.doi.org/10.1063/1.1567043 (2 pages) | Cited 17 times

Online Publication Date: 7 April 2003

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Experiments are reported by Breazeale and Torbett [Appl. Phys. Lett. 29, 456 (1976)] that visualize ultrasonic backward beam displacement due to the excitation of surface waves by means of diffraction. The authors have simulated these experiments using the concept of inhomogeneous waves. Such waves have proven to be well suited in predicting beam displacements on plane interfaces. It is now found that inhomogeneous waves are even capable of predicting the experimentally observed displacement phenomena on periodic rough surfaces. © 2003 American Institute of Physics.
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43.35.Cg Ultrasonic velocity, dispersion, scattering, diffraction, and attenuation in solids; elastic constants
62.65.+k Acoustical properties of solids
43.20.El Reflection, refraction, diffraction of acoustic waves
43.25.Jh Reflection, refraction, interference, scattering, and diffraction of intense sound waves

Free-space focused-beam characterization of left-handed materials

Kin Li, S. J. McLean, R. B. Greegor, C. G. Parazzoli, and M. H. Tanielian

Appl. Phys. Lett. 82, 2535 (2003); http://dx.doi.org/10.1063/1.1567454 (3 pages) | Cited 61 times

Online Publication Date: 7 April 2003

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We used a broadband, free-space, focused-beam system to measure the transmission and reflection in left-handed-material (LHM) slabs. The samples were made of alternating patterns of copper wires and split-ring resonators on Rogers 5880 substrates separated by Rohacell™ spacers. The measured data show very good agreement with numerical simulations. The measured insertion loss of this structure was −1.1 dB/cm at the LHM pass band. Simulations suggest that the loss may be attributable to the finite conductivity of the copper patterns. © 2003 American Institute of Physics.
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84.40.Dc Microwave circuits
73.25.+i Surface conductivity and carrier phenomena

Metal layer Bragg–Fresnel lenses for diffraction focusing of hard x-rays

Youli Li, Mario Yasa, Olivier Pelletier, Cyrus R. Safinya, Ernie Caine, Evelyn E. Hu, and Patricia Fernandez

Appl. Phys. Lett. 82, 2538 (2003); http://dx.doi.org/10.1063/1.1567456 (3 pages) | Cited 6 times

Online Publication Date: 7 April 2003

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A thin-film Bragg–Fresnel lens (BFL) was developed for diffractive focusing of hard x-rays into submicron to nanometer spots for scanning x-ray spectromicroscopy. The lens is made of metal-layer Fresnel zones deposited on an x-ray reflective substrate. The use of a high-density lens structure reduces the thickness of the lens and simplifies the fabrication process. Linear and elliptical lenses made of a 200-nm-thick Au film were fabricated using e-beam lithography and a metal deposition process. The focusing capabilities of the Au layer BFLs were demonstrated at the Advanced Photon Source. © 2003 American Institute of Physics.
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07.85.Jy Diffractometers
07.85.Tt X-ray microscopes
42.82.Cr Fabrication techniques; lithography, pattern transfer
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