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13 Jan 2003

Volume 82, Issue 2, pp. 155-309

Issue Cover Spotlight Figure

Appl. Phys. Lett. 82, 266 (2003); http://dx.doi.org/10.1063/1.1535271 (3 pages)

Jan Genzer, Daniel A. Fischer, and Kirill Efimenko
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Determination of interface energy band diagram between (100)Si and mixed Al–Hf oxides using internal electron photoemission

V. V. Afanas’ev, A. Stesmans, and W. Tsai

Appl. Phys. Lett. 82, 245 (2003); http://dx.doi.org/10.1063/1.1532550 (3 pages) | Cited 26 times

Online Publication Date: 6 January 2003

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Internal electron photoemission is used to investigate the electronic structure of the Si/Hf–Al oxide interfaces as a function of oxide composition. In the mixed oxides, the energy position and the density of states in the conduction band show little sensitivity to the Hf content. At the same time, the energy band diagram of the Si/oxide interface appears to be very close to that of the Si/Al2O3 interface, suggesting that the conduction band is derived mostly from the states of Al ions. © 2003 American Institute of Physics.
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73.20.At Surface states, band structure, electron density of states
73.40.Qv Metal-insulator-semiconductor structures (including semiconductor-to-insulator)
73.50.Pz Photoconduction and photovoltaic effects
73.61.Cw Elemental semiconductors
79.60.Jv Interfaces; heterostructures; nanostructures

Polarization dynamics and retention loss in fatigued PbZr0.4Ti0.6O3 ferroelectric capacitors

B. S. Kang, Jong-Gul Yoon, T. W. Noh, T. K. Song, S. Seo, Y. K. Lee, and J. K. Lee

Appl. Phys. Lett. 82, 248 (2003); http://dx.doi.org/10.1063/1.1534411 (3 pages) | Cited 24 times

Online Publication Date: 6 January 2003

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Short-time retention loss behaviors were investigated for fatigued Pt/PbZr0.4Ti0.6O3/Pt capacitors. In the short-time regime of t<1 s, fatigued capacitors showed a significant loss in retained polarization, which could be well described by a power-law function. This behavior was interpreted in terms of a superposition of polarization relaxations with a relaxation time distribution. The effects of the pulse voltage on the relaxation time distribution suggested that the retention loss should be activated by a depolarization field. As the fatigue stress was applied, the retention loss became worse. This effect can be explained in terms of the increase of the depolarization field, possibly due to the growth of an interfacial passive layer. © 2003 American Institute of Physics.
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84.32.Tt Capacitors
85.50.-n Dielectric, ferroelectric, and piezoelectric devices
77.22.Ej Polarization and depolarization
77.22.Gm Dielectric loss and relaxation
77.80.Fm Switching phenomena
77.84.Ek Niobates and tantalates
77.84.Cg PZT ceramics and other titanates

High-Tm relaxor ferroelectrics: 0.3BiScO3–0.6PbTiO3–0.1Pb(Mn1/3Nb2/3)O3

Jungho Ryu, Shashank Priya, and Kenji Uchino

Appl. Phys. Lett. 82, 251 (2003); http://dx.doi.org/10.1063/1.1536028 (3 pages) | Cited 14 times

Online Publication Date: 6 January 2003

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High-Tm relaxor materials are being developed for high-temperature high-power density electrotransduction applications and high-temperature capacitors in automobile applications. A relaxor ferroelectric material of composition 0.3BiScO3–0.6PbTiO3–0.1Pb(Mn1/3Nb2/3)O3 having a very high dielectric maximum of ∼ 350 °C is reported. The relaxor behavior is confirmed by studying polarization relaxation and frequency and temperature dependent dielectric behavior. The dielectric constant in the low-temperature region of 10 °C<T<150 °C is found to be independent of the frequency with a temperature gradient of ∂ε/∂T = 2.5/°C. The room-temperature magnitude of dielectric constant is ∼ 600. © 2003 American Institute of Physics.
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77.84.Ek Niobates and tantalates
77.84.Cg PZT ceramics and other titanates
77.22.Ch Permittivity (dielectric function)
77.80.Dj Domain structure; hysteresis
77.22.Ej Polarization and depolarization

Ultraviolet-induced discharge currents and reduction of the piezoelectric coefficient in cellular polypropylene films

Axel Mellinger, Francisco Camacho González, and Reimund Gerhard-Multhaupt

Appl. Phys. Lett. 82, 254 (2003); http://dx.doi.org/10.1063/1.1537051 (3 pages) | Cited 9 times

Online Publication Date: 6 January 2003

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Photostimulated discharge spectroscopy of cellular polypropylene films between 200 and 400 nm showed the existence of at least three distinct trapping levels at 4.6, 5.6, and 6.3 eV. The effects of UV irradiation on the piezoelectric d33 coefficient was studied by monitoring thickness-extension resonances in the dielectric spectrum. Prolonged irradiation at wavelengths below 210 nm led to a reduction of the piezoelectric coefficient, caused by partial discharge of the polymer foam.© 2003 American Institute of Physics.
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77.84.Jd Polymers; organic compounds
77.55.-g Dielectric thin films
61.82.Pv Polymers, organic compounds
77.65.Bn Piezoelectric and electrostrictive constants
77.22.Jp Dielectric breakdown and space-charge effects
61.80.Ba Ultraviolet, visible, and infrared radiation effects (including laser radiation)
71.55.Ht Other nonmetals
73.50.Pz Photoconduction and photovoltaic effects
73.61.Ph Polymers; organic compounds
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