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22 Sep 2003

Volume 83, Issue 12, pp. 2303-2490

Issue Cover Spotlight Figure

Appl. Phys. Lett. 83, 2396 (2003); http://dx.doi.org/10.1063/1.1613038 (3 pages)

A. Rida, V. Fernandez, and M. A. M. Gijs
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Time-resolved measurement of the refractive index for photopolymerization processes

Kokou Dorkenoo, A. J. van Wonderen, Hervé Bulou, Michelangelo Romeo, Olivier Crégut, and Alain Fort

Appl. Phys. Lett. 83, 2474 (2003); http://dx.doi.org/10.1063/1.1608484 (3 pages) | Cited 13 times

Online Publication Date: 15 September 2003

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A double-interferometer technique is employed to examine the dynamics of a photopolymerization process. The dye molecule is eosine Y. The refractive index and the thickness of the photopolymerizable film are measured as a function of time. During the photopolymerization process, the first quantity increases by 2%, while the second quantity decreases by more than 4%. Therefore, the refractive index cannot be measured by means of single-interferometer techniques. By fitting our experimental curves to a rate equation, the quantum yield and the absorption coefficient of the sample can be determined with good accuracy. © 2003 American Institute of Physics.
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82.50.-m Photochemistry
82.35.Gh Polymers on surfaces; adhesion
82.20.Pm Rate constants, reaction cross sections, and activation energies
78.20.Ci Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)
61.41.+e Polymers, elastomers, and plastics
82.35.-x Polymers: properties; reactions; polymerization
78.47.-p Spectroscopy of solid state dynamics

Terahertz imaging using an interferometric array

John F. Federici, Dale Gary, Brian Schulkin, Feng Huang, Hakan Altan, Robert Barat, and David Zimdars

Appl. Phys. Lett. 83, 2477 (2003); http://dx.doi.org/10.1063/1.1610799 (3 pages) | Cited 16 times

Online Publication Date: 15 September 2003

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Most methods of imaging in the terahertz (THz) spectral region utilize either pulsed-laser sources or require the THz generation and detection sources to be phase coherent. The application of interferometric imaging to the THz range is described. Interferometric imaging offers considerable advantages in this regard due to its ability to image with only a handful of detector elements, image many sources of THz radiation at once, image incoherent as well as coherent sources, and provide spectral information as well as spatial imaging information. The THz interferometric imaging method is potentially useful for remote detection of explosives. © 2003 American Institute of Physics.
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07.57.-c Infrared, submillimeter wave, microwave and radiowave instruments and equipment

Near-field light emission from nano- and micrometric complex structures

M. Pieruccini, S. Savasta, R. Girlanda, R. C. Iotti, and F. Rossi

Appl. Phys. Lett. 83, 2480 (2003); http://dx.doi.org/10.1063/1.1608483 (3 pages) | Cited 5 times

Online Publication Date: 15 September 2003

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We propose a general theoretical scheme for the investigation of light emitted from nano- and micrometric structures of arbitrary shape and composition. More specifically, the proposed fully three-dimensional approach allows to derive the light-intensity distributions around the emitting structures and their modifications in the presence of nearby scattering objects. Our analysis allows to better identify the nontrivial relationship between near-field images and fluorescent objects. © 2003 American Institute of Physics.
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42.50.Ct Quantum description of interaction of light and matter; related experiments
42.25.Fx Diffraction and scattering

Shock wave coupling between terahertz transmission lines on GaAs

L. Desplanque, E. Peytavit, J.-F. Lampin, D. Lippens, and F. Mollot

Appl. Phys. Lett. 83, 2483 (2003); http://dx.doi.org/10.1063/1.1610245 (3 pages) | Cited 5 times

Online Publication Date: 15 September 2003

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We experimentally study the behavior of an electromagnetic shock wave radiated by a picosecond electrical pulse propagating on a coplanar stripline at the interface between air and a GaAs substrate. The shock wave is directly measured by time-resolved electroabsorption sampling. We show that after a few millimeters of propagation this shock wave is in fact constituted by substrate modes causing large leakage resonances in the spectrum of the propagating pulse. At last, we show that the presence of adjacent transmission lines on the substrate has an influence on these leakage resonances. © 2003 American Institute of Physics.
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78.20.Jq Electro-optical effects
62.50.-p High-pressure effects in solids and liquids
84.40.Az Waveguides, transmission lines, striplines

Atomic force microscope laser illumination effects on a sample and its application for transient spectroscopy

G. H. Buh and J. J. Kopanski

Appl. Phys. Lett. 83, 2486 (2003); http://dx.doi.org/10.1063/1.1613800 (3 pages) | Cited 10 times

Online Publication Date: 15 September 2003

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The effect of illumination from the laser of an optical-beam-deflection atomic force microscope (AFM) on a semiconductor sample is monitored with a (connected in parallel) scanning capacitance microscope (SCM). The photoexcitation of carriers in a silicon sample is quantified using the SCM measured capacitance–voltage curves. A significant difference is seen between SCM capacitance–voltage characteristics measured under true-dark and normal (illuminated) conditions, and is attributed to light spillage over the edges of the AFM cantilever and light transmission through the cantilever. We developed a light-induced transient spectroscopy through simple modification of a commercial SCM and demonstrate it as a tool for the measurement of carrier lifetime with microscopic scale. © 2003 American Institute of Physics.
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07.79.Lh Atomic force microscopes
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