Appl. Phys. Lett. 83, 2716 (2003); http://dx.doi.org/10.1063/1.1606890 (2 pages)
Comment on “Ferromagnetism in Cr-doped Ge” [Appl. Phys. Lett. 81, 3606 (2002)]
(Received 3 April 2003; accepted 8 July 2003)
Abstract unavailable.
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- Ferromagnetism in Cr-doped Ge
Sungyoul Choi et al.
Appl. Phys. Lett. 81, 3606 (2002)APPLAB000081000019003606000001
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- S. Choi, S. C. Hong, S. Cho, Y. Kim, J. B. Ketterson, C.-U. Jung, K. Rhie, B.-J. Kim, and Y. C. Kim, Appl. Phys. Lett. 81, 3606 (2002)APPLAB000081000019003606000001. [ISI]
- A. B. Gokhale and G. J. Abbaschian, in Binary Alloy Phase Diagrams, 2nd ed., edited by T. B. Massalski (ASM Materials Park, Ohio, 1990), Vol. 2, p. 1275.
- Landolt-Bornstein, Numerical Data and Functional Relationships in Science and Technology, New Series III/19c, edited by O. Madelung (Springer, Berlin, 1988), p. 12.
- B. E. Warren, X-Ray Diffraction (Dover, New York, 1990), p. 29.
- With a sensitivity of 0.01 and assuming 1 µm host-particle size, the dif-fraction intensity from precipitates of less than 0.4 µm will be lost in the noise level.
- Y. D. Park, A. T. Hanbicki, S. C. Erwin, C. S. Hellberg, J. M. Sullivan, J. E. Mattson, T. F. Ambrose, A. Wilson, G. Spanos, and B. T. Jonker, Science (Washington, DC, U.S.) 295, 651 (2002). [MEDLINE]
- H. Ohno, A. Shen, F. Matsukura, A. Oiwa, A. Endo, S. Katsumoto, and Y. Iye, Appl. Phys. Lett. 69, 363 (1996)APPLAB000069000003000363000001.
- M. E. Overberg, B. P. Gila, G. T. Thaler, C. R. Abernathy, S. J. Pearton, N. A. Theodoropoulou, K. T. McCarthy, S. B. Arnason, A. F. Hebard, S. N. G. Chu, R. G. Wilson, J. M. Zavada, and Y. D. Park, J. Vac. Sci. Technol. B 20, 969 (2002)JVTBD9000020000003000969000001.
- W. W. Lee and R. J. Sladek, Phys. Rev. 158, 794 (1967). [ISI]















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