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27 Oct 2003

Volume 83, Issue 17, pp. 3447-3628

Issue Cover Spotlight Figure

Appl. Phys. Lett. 83, 3453 (2003); http://dx.doi.org/10.1063/1.1622431 (3 pages)

Giacomo Scalari, Stéphane Blaser, Lassaad Ajili, Jérôme Faist, Harvey Beere, Edmund Linfield, David Ritchie, and Giles Davies
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Atomic resolution noncontact atomic force/scanning tunneling microscopy using a 1 MHz quartz resonator

Seiji Heike and Tomihiro Hashizume

Appl. Phys. Lett. 83, 3620 (2003); http://dx.doi.org/10.1063/1.1623012 (3 pages) | Cited 13 times

Online Publication Date: 20 October 2003

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A 1 MHz quartz length extension resonator is used as a force sensor for a noncontact atomic force/scanning tunneling microscope (AFM/STM). A tungsten probe tip glued onto the end of the quartz rod enables the detection of tunneling currents for STM observation. Au surface was observed in both AFM and STM modes. The resolution difference is discussed in terms of the insulating oxide layer on the tip. We also demonstrate the AFM/STM observation of the Si(111)-7×7 surface with atomic resolution in an ultrahigh vacuum. © 2003 American Institute of Physics.
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07.79.Lh Atomic force microscopes
07.79.Cz Scanning tunneling microscopes
68.37.Ps Atomic force microscopy (AFM)
68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)
77.65.Fs Electromechanical resonance; quartz resonators
77.84.Bw Elements, oxides, nitrides, borides, carbides, chalcogenides, etc.
85.50.-n Dielectric, ferroelectric, and piezoelectric devices

Complete characterization of the nonlinear spatial distribution induced in poled silica glass with a submicron resolution

A. Kudlinski, Y. Quiquempois, M. Lelek, H. Zeghlache, and G. Martinelli

Appl. Phys. Lett. 83, 3623 (2003); http://dx.doi.org/10.1063/1.1622449 (3 pages) | Cited 22 times

Online Publication Date: 20 October 2003

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The evolution of the second-harmonic signal is monitored as the poled sample is etched with hydrofluoric acid. The sample thickness is measured in real time using an interferometric method. The full set of data allows us to fully reconstruct the nonlinear spatial distribution created inside the glass, whatever the nonlinearities’ origin. © 2003 American Institute of Physics.
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42.70.Ce Glasses, quartz
42.70.Nq Other nonlinear optical materials; photorefractive and semiconductor materials
42.65.Ky Frequency conversion; harmonic generation, including higher-order harmonic generation
81.65.Cf Surface cleaning, etching, patterning
06.30.Bp Spatial dimensions (e.g., position, lengths, volume, angles, and displacements)
81.05.Kf Glasses (including metallic glasses)
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