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7 Jun 2004

Volume 84, Issue 23, pp. 4599-4816

Issue Cover Spotlight Figure

Appl. Phys. Lett. 84, 4650 (2004); http://dx.doi.org/10.1063/1.1759390 (3 pages)

David I. Woodward, Ian M. Reaney, Gaiying Y. Yang, Elizabeth C. Dickey, and Clive A. Randall
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Enhanced mass sensing using torsional and lateral resonances in microcantilevers

L. B. Sharos, A. Raman, S. Crittenden, and R. Reifenberger

Appl. Phys. Lett. 84, 4638 (2004); http://dx.doi.org/10.1063/1.1759379 (3 pages) | Cited 36 times

Online Publication Date: 19 May 2004

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We present a method to detect, with enhanced sensitivity, a target mass particle attached eccentrically to a microcantilever by measuring multiple three-dimensional modes in the microcantilever vibration spectrum. Peaks in the spectrum reveal a complex coupling between the bending, torsional, and lateral motions and detailed finite element models assist in their interpretation. The mass sensitivities of the torsional and lateral mode frequencies are an order of magnitude greater, and their Q factors significantly higher, than that of the conventionally used fundamental bending mode. These modes offer significantly enhanced mass sensing capabilities within the realm of existing microcantilever technology. © 2004 American Institute of Physics.
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06.30.Dr Mass and density
07.10.Cm Micromechanical devices and systems

Quantitative microwave evanescent microscopy of dielectric thin films using a recursive image charge approach

Chen Gao, Bo Hu, Pu Zhang, Mengming Huang, Wenhan Liu, and I. Takeuchi

Appl. Phys. Lett. 84, 4647 (2004); http://dx.doi.org/10.1063/1.1759389 (3 pages) | Cited 17 times

Online Publication Date: 19 May 2004

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A recursive image charge approach has been successfully developed for quantitative microwave microscopy of dielectric thin films using the scanning evanescent microwave microscope. With this approach and the recursion-to-circulation algorithm, frequency shift of the microscope as functions of the thickness of the film, dielectric constants of the film and the substrate can be efficiently computed in a circulation way. © 2004 American Institute of Physics.
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77.22.Ch Permittivity (dielectric function)
77.55.-g Dielectric thin films

Fast Fourier demodulation

Yuval Carmon and Erez N. Ribak

Appl. Phys. Lett. 84, 4656 (2004); http://dx.doi.org/10.1063/1.1759770 (2 pages) | Cited 3 times

Online Publication Date: 19 May 2004

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We present a fast Fourier demodulation method for calculating the distortion in a repetitive pattern. The technique is based on applying digital demodulation, then using only the anti-Hermitian part of the pattern in Fourier space. After demodulation, we are left with the Fourier transform of the sought phase information only. Using also the Hermitian part, we would have gotten the object itself. We investigate the boundaries of the technique, as related to aberration content, amplitude variations, and sensitivity to noise. © 2004 American Institute of Physics.
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02.30.Nw Fourier analysis
02.70.-c Computational techniques; simulations

Origin of low-friction behavior in graphite investigated by surface x-ray diffraction

Bing K. Yen, Birgit E. Schwickert, and Michael F. Toney

Appl. Phys. Lett. 84, 4702 (2004); http://dx.doi.org/10.1063/1.1760597 (3 pages) | Cited 12 times

Online Publication Date: 19 May 2004

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Contrary to popular belief, the slipperiness of graphite is not an intrinsic property. The presence of vapors, such as water, is required for graphite to lubricate; in vacuum or dry environments, the friction and wear rate of graphite are high. A widely accepted explanation involves weakening of the binding force between basal planes near the surface, thereby allowing these planes to shear easily. This weakening results from proposed chemisorption or intercalation of vapor molecules near the surface, leading to an increase in the interlayer spacing between near-surface basal planes. Here we use x-ray diffraction from a synchrotron source to show that the basal plane spacing at the surface is the same in vacuum, ambient air, or water vapor saturated air. These results refute this long-held view that the low friction behavior of graphite is due to shearing of weakened basal planes. © 2004 American Institute of Physics.
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81.40.Pq Friction, lubrication, and wear
62.20.Qp Friction, tribology, and hardness
68.43.Mn Adsorption kinetics
68.35.Af Atomic scale friction
83.85.Hf X-ray and neutron scattering
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