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15 Nov 2004

Volume 85, Issue 20, pp. 4561-4807

Issue Cover Spotlight Figure

Appl. Phys. Lett. 85, 4768 (2004); http://dx.doi.org/10.1063/1.1818331 (3 pages)

G. Walter, N. Holonyak, M. Feng, and R. Chan
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A phase retrieval algorithm for shifting illumination

J. M. Rodenburg and H. M. L. Faulkner

Appl. Phys. Lett. 85, 4795 (2004); http://dx.doi.org/10.1063/1.1823034 (3 pages) | Cited 72 times

Online Publication Date: 16 November 2004

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We propose a method of iterative phase retrieval that uses measured intensities in the diffraction plane to solve the phase problem in a way that bypasses the problem of lens aberration, leading to greatly improved spatial resolution. This method is stable, easy to implement experimentally, and can be used to view a large area of the specimen when that is desired.
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42.79.Bh Lenses, prisms and mirrors
42.25.Fx Diffraction and scattering
42.15.Fr Aberrations

Energy-dispersive small-angle x-ray scattering for investigating polymer morphology: Static and time-resolved experiments

Giuseppe Portale, Alessandro Longo, Lucio D’Ilario, Andrea Martinelli, and Ruggero Caminiti

Appl. Phys. Lett. 85, 4798 (2004); http://dx.doi.org/10.1063/1.1823586 (3 pages)

Online Publication Date: 16 November 2004

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Energy-dispersive small-angle x-ray scattering couples the information given by small-angle experiments and the advantages of energy-dispersive methods, mainly in carrying out time-resolved experiments. Preliminary small-angle measurements on some semicrystalline polymers using a laboratory-based energy-dispersive diffractometer and the bremsstrahlung continuum generated from a commercial tube as x-ray source are presented. The results are in agreement with those obtained with the classical method. The apparatus utilized could be considered a promising tool to perform both wide and small-angle scattering or diffraction.
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78.70.Ck X-ray scattering
61.41.+e Polymers, elastomers, and plastics
78.47.-p Spectroscopy of solid state dynamics

Kelvin probe force microscopy on corona charged oxidized semiconductor surfaces

B. Lägel, M. D. Ayala, and R. Schlaf

Appl. Phys. Lett. 85, 4801 (2004); http://dx.doi.org/10.1063/1.1818343 (3 pages) | Cited 1 time

Online Publication Date: 16 November 2004

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We present results demonstrating that Kelvin probe force microscopy (KPFM) can be used with high accuracy for corona charge aided oxide thickness mapping. In our experiments, corona charge layers of varying density were deposited onto the surface of thermally oxidized silicon wafers with different oxide thicknesses. After deposition, the surface potentials of the samples were characterized using both the standard Kelvin probe method and KPFM. Comparison of the surface potentials measured by both techniques showed that the values are in excellent agreement, and that only insignificant discharging of the corona charge layer occurred during the topography scan necessary in KPFM measurements.
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68.55.A- Nucleation and growth
52.80.Hc Glow; corona
68.35.B- Structure of clean surfaces (and surface reconstruction)
68.37.Ps Atomic force microscopy (AFM)

Unshielded three-axis vector operation of a spin-exchange-relaxation-free atomic magnetometer

S. J. Seltzer and M. V. Romalis

Appl. Phys. Lett. 85, 4804 (2004); http://dx.doi.org/10.1063/1.1814434 (3 pages) | Cited 26 times

Online Publication Date: 16 November 2004

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We describe a vector alkali–metal magnetometer that simultaneously and independently measures all three components of the magnetic field. Using a feedback system, the total field at the location of the magnetometer is kept near zero, suppressing the broadening due to spin-exchange collisions. The resonance linewidth and signal strength of the magnetometer compare favorably with two different scalar operation modes in which spin-exchange relaxation is only partially suppressed. Magnetic field sensitivity on the order of 1 pT∕math is demonstrated in a laboratory environment without magnetic shields.
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07.55.Ge Magnetometers for magnetic field measurements
75.40.Gb Dynamic properties (dynamic susceptibility, spin waves, spin diffusion, dynamic scaling, etc.)
85.75.Ss Magnetic field sensors using spin polarized transport
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