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6 Dec 2004

Volume 85, Issue 23, pp. 5499-5791

Issue Cover Spotlight Figure

Appl. Phys. Lett. 85, 5694 (2004); http://dx.doi.org/10.1063/1.1828575 (3 pages)

M. Y. Shen, C. H. Crouch, J. E. Carey, and E. Mazur
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Publisher’s Note: “Probing subpicosecond dynamics using pulsed laser combined scanning tunneling microscopy” [Appl. Phys. Lett. 85, 3268 (2004)]

Osamu Takeuchi, Masahiro Aoyama, Ryuji Oshima, Yoshitaka Okada, Haruhiro Oigawa, Nobuyuki Sano, Hidemi Shigekawa, Ryuji Morita, and Mikio Yamashita

Appl. Phys. Lett. 85, 5790 (2004); http://dx.doi.org/10.1063/1.1839180 (1 page)

Online Publication Date: 8 December 2004

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Abstract Unavailable
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99.10.Fg Publisher's note
68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)
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Erratum: Scanning-tunneling-microscope-assisted assembling of hydrogen-saturated silicon clusters on Si(111)‐(7×7) surfaces [Appl. Phys. Lett. 78, 3720 (2001)]

Leonid Bolotov, Noriyuki Uchida, and Toshihiko Kanayama

Appl. Phys. Lett. 85, 5791 (2004); http://dx.doi.org/10.1063/1.1835559 (1 page)

Online Publication Date: 8 December 2004

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Abstract Unavailable
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99.10.-x Errata and other corrections
68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)
81.05.Cy Elemental semiconductors
61.82.Ms Insulators
81.65.-b Surface treatments
61.80.Jh Ion radiation effects
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