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2 Aug 2004

Volume 85, Issue 5, pp. 701-848

Issue Cover Spotlight Figure

Appl. Phys. Lett. 85, 807 (2004); http://dx.doi.org/10.1063/1.1777817 (3 pages)

Henry J. Liu and Kyeongjae Cho
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Quantitative analysis of nanoscale switching in SrBi2Ta2O9 thin films by piezoresponse force microscopy

Sergei V. Kalinin, Alexei Gruverman, and Dawn A. Bonnell

Appl. Phys. Lett. 85, 795 (2004); http://dx.doi.org/10.1063/1.1775881 (3 pages) | Cited 41 times

Online Publication Date: 27 July 2004

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Local switching properties in SrBi2Ta2O9 thin films have been studied by spatially resolved piezoresponse force microscopy (PFM) and spectroscopy. Variations in PFM contrast of individual grains due to their random crystallographic orientation are consistent with the grain switching behavior examined via vertical and lateral hysteresis loops. Theoretical description of vertical hysteresis loop shape obtained in the point-charge approximation is shown to be in good agreement with the experimental data. Dependence of the hysteresis loop parameters on the grain crystallographic orientation is analyzed. It has been found that grain deviation from the ideal (010) orientation when the polar axis is normal to the film plane results in the decrease of the PFM signal and increase of the coercive voltage in agreement with theoretical predictions.
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77.55.-g Dielectric thin films
77.84.Ek Niobates and tantalates
77.84.Cg PZT ceramics and other titanates
77.80.Fm Switching phenomena
77.80.Dj Domain structure; hysteresis
68.55.-a Thin film structure and morphology
68.37.Ps Atomic force microscopy (AFM)
68.35.B- Structure of clean surfaces (and surface reconstruction)

Study of surface acoustic phonon modes in relaxor Pb(Mg1∕3Nb2∕3)O3

V. Sivasubramanian, R. Kesavamoorthy, V. S. Sastry, and V. Subramanian

Appl. Phys. Lett. 85, 798 (2004); http://dx.doi.org/10.1063/1.1776328 (3 pages) | Cited 2 times

Online Publication Date: 27 July 2004

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Surface acoustic phonon modes in pelletized polycrystalline Pb(Mg1∕3Nb2∕3)O3 are investigated in the frequency range from 5 to 40 cm−1 at various temperatures from 25 to 550 °C. These spectra support the hypothesis of the core-shell nanoclusters with 1:1 ordered, negatively charged nanocore surrounded by the charge compensating positively charged disordered nanoshell. These surface acoustic modes exist even up to 550 °C revealing the existence of the charged core-shell nanoclusters which is well beyond the dissolution temperature of the polar clusters in the material.
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77.84.Ek Niobates and tantalates
77.84.Cg PZT ceramics and other titanates
77.80.-e Ferroelectricity and antiferroelectricity
63.22.-m Phonons or vibrational states in low-dimensional structures and nanoscale materials
78.30.Hv Other nonmetallic inorganics

Dielectric relaxor behavior of Cd2Nb2O7

Zhi Yu and Chen Ang

Appl. Phys. Lett. 85, 801 (2004); http://dx.doi.org/10.1063/1.1775038 (3 pages) | Cited 3 times

Online Publication Date: 27 July 2004

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The dc electric-field dependence of the dielectric properties of cadmium niobate Cd2Nb2O7 single crystals is studied, and characteristics of the dielectric behavior of Cd2Nb2O7 under dc bias are revealed. The temperature (Tm) where the dielectric relaxation mode occurs is independent of dc bias levels, while its intensity is greatly suppressed and finally eliminated with increasing dc bias from 0 to 15   kV∕cm. The observed dielectric relaxation features of Cd2Nb2O7 can be attributed to “dielectric relaxor” behavior, rather than “ferroelectric relaxor” behavior previously designated in literature. The physical nature of the dielectric relaxor behavior is briefly discussed.
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77.84.Ek Niobates and tantalates
77.84.Cg PZT ceramics and other titanates
77.22.Gm Dielectric loss and relaxation
77.80.B- Phase transitions and Curie point

Ferroelectric and electrical behavior of (Na0.5Bi0.5)TiO3 thin films

Z. H. Zhou, J. M. Xue, W. Z. Li, J. Wang, H. Zhu, and J. M. Miao

Appl. Phys. Lett. 85, 804 (2004); http://dx.doi.org/10.1063/1.1771808 (3 pages) | Cited 35 times

Online Publication Date: 27 July 2004

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Sodium bismuth titanate (Na0.5Bi0.5)TiO3 (NBT) of perovskite structure is among the best known lead-free piezoelectric∕ferroelectric that promises a number of applications in sensors and actuators. However, NBT in thin film form has not been properly investigated, although NBT in bulk ceramic form has been widely studied. In this letter, we report the growth of polycrystalline NBT thin films by radio-frequency magnetron sputtering and their ferroelectric behavior. The NBT thin films exhibit a well-defined hysteresis loop, with a remanent polarization of 11.9 μC∕cm2 and coercive field of 37.9 kV∕cm when measured at room temperature. There is a steady decrease of dielectric constant in the range of 650–470 over the frequency range of 10–105 Hz. A change in the controlling mechanism of electrical behavior from the grain interior to the grain boundary is observed for the NBT thin film with increasing temperature. Hopping of oxygen vacancies trapped at the grain boundaries is responsible for the high dielectric loss at low frequencies and high dc conductivity observed.
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77.55.-g Dielectric thin films
77.80.Dj Domain structure; hysteresis
81.15.Cd Deposition by sputtering
61.72.Mm Grain and twin boundaries
61.72.J- Point defects and defect clusters
77.22.Ch Permittivity (dielectric function)
77.22.Gm Dielectric loss and relaxation
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