Sodium bismuth titanate (Na0.5Bi0.5)TiO3 (NBT) of perovskite structure is among the best known lead-free piezoelectric∕ferroelectric that promises a number of applications in sensors and actuators. However, NBT in thin film form has not been properly investigated, although NBT in bulk ceramic form has been widely studied. In this letter, we report the growth of polycrystalline NBT thin films by radio-frequency magnetron sputtering and their ferroelectric behavior. The NBT thin films exhibit a well-defined hysteresis loop, with a remanent polarization of 11.9 μC∕cm2 and coercive field of 37.9 kV∕cm when measured at room temperature. There is a steady decrease of dielectric constant in the range of 650–470 over the frequency range of 10–105 Hz. A change in the controlling mechanism of electrical behavior from the grain interior to the grain boundary is observed for the NBT thin film with increasing temperature. Hopping of oxygen vacancies trapped at the grain boundaries is responsible for the high dielectric loss at low frequencies and high dc conductivity observed.