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11 Apr 2005

Volume 86, Issue 15, Articles (15xxxx)

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Appl. Phys. Lett. 86, 152101 (2005); http://dx.doi.org/10.1063/1.1897831 (3 pages)

Walid Hafez and Milton Feng
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Optical modulation processes in thin films based on thermal effects of surface plasmons

A. L. Lereu, A. Passian, J-P. Goudonnet, T. Thundat, and T. L. Ferrell

Appl. Phys. Lett. 86, 154101 (2005); http://dx.doi.org/10.1063/1.1900311 (3 pages) | Cited 22 times

Online Publication Date: 4 April 2005

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Experimental results are presented for light-on-light modulation at low rates using coupling to nonradiative surface plasmons and their associated thermal effects in a thin gold foil. It is first shown that several modulated Gaussian beams simultaneously exciting surface plasmons in the same region of a thin gold film, will result in a coupling that is revealed in the reflected beams. The observed effects result in the reflected beams undergoing changes in both spatial distribution and intensity levels. A brief study is then presented of the coupling between surface plasmons and an electrical current in the excitation region to further support the role of the surface plasmon induced thermal processes in the gold foil.
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73.20.Mf Collective excitations (including excitons, polarons, plasmons and other charge-density excitations)
71.45.d
68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)
68.37.Uv Near-field scanning microscopy and spectroscopy

Nucleation and growth of platelets in hydrogen-ion-implanted silicon

Michael Nastasi, Tobias Höchbauer, Jung-Kun Lee, Amit Misra, John P. Hirth, Mark Ridgway, and Tamzin Lafford

Appl. Phys. Lett. 86, 154102 (2005); http://dx.doi.org/10.1063/1.1900309 (3 pages) | Cited 37 times

Online Publication Date: 5 April 2005

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H ion implantation into crystalline Si is known to result in the precipitation of planar defects in the form of platelets. Hydrogen-platelet formation is critical to the process that allows controlled cleavage of Si along the plane of the platelets and subsequent transfer and integration of thinly sliced Si with other substrates. Here we show that H-platelet formation is controlled by the depth of the radiation-induced damage and then develop a model that considers the influence of stress to correctly predict platelet orientation and the depth at which platelet nucleation density is a maximum.
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61.80.Az Theory and models of radiation effects
61.72.uf Ge and Si
61.82.Fk Semiconductors

Lateral-field-excited thin-film Lamb wave resonator

Johan Bjurström, Ilia Katardjiev, and Ventsislav Yantchev

Appl. Phys. Lett. 86, 154103 (2005); http://dx.doi.org/10.1063/1.1900312 (3 pages) | Cited 14 times

Online Publication Date: 5 April 2005

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The basic principles and technology for the development of lateral-field-excited Lamb acoustic wave resonators on sputter-deposited c-oriented thin aluminum nitride films are presented. The experimental results demonstrate that Lamb waves can be successfully used as an alternative to high-velocity surface acoustic waves.
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62.25.+d
68.60.Bs Mechanical and acoustical properties
77.65.Fs Electromechanical resonance; quartz resonators

Self-assembled monolayer cleaning methods: Towards fabrication of clean high-temperature superconductor nanostructures

Sungwook Kim, In Soon Chang, and John T. McDevitt

Appl. Phys. Lett. 86, 154104 (2005); http://dx.doi.org/10.1063/1.1899753 (3 pages) | Cited 4 times

Online Publication Date: 5 April 2005

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Although extensive amounts of research have been carried out on superconductor-normal metal-superconductor (SNS) electronic devices, the fabrication of superconductor SNS devices still remains difficult. Surface modification of high-temperature superconductors could be a way to control the interface of SNS electronic device fabrication. Here, we developed a cleaning method for thin films of high-temperature superconductor surface based on self-assembled monolayers. High-quality c-axis orientated YBa2Cu3O7−δ (i.e., YBCO) and Y0.6Ca0.4Ba1.6La0.4Cu3O7−δ (i.e., TX-YBCO) thin films were deposited by standard laser ablation methods. YBCO/Au/YBCO and TX-YBCO/Au/TX-YBCO planar type junctions were fabricated by photolithography, focused-ion-beam milling, and ex situ sputter depositions. A 40–50 nm nanotrench was ion milled on the thin film by FIB, and a thin gold layer was deposited by an ex situ method on the nanotrench to connect the two separated high-temperature superconductor electrodes. SEM, AFM, and R vs T resistivity measurements were used to compare the corrosion layer formed in the interface of the SNS junctions with the SAM cleaned SNS junction. Evidence here suggests that the SAM cleaning method can be used to remove the degradation layer on the surface of cuprate superconductors. The obtained contact resistivity value, (10−8 Ω cm2) for a SNS junction with SAM treatment is comparable with that of SNS junctions fabricated by the in situ methods.
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74.78.Na Mesoscopic and nanoscale systems
74.78.-w Superconducting films and low-dimensional structures
74.72.-h Cuprate superconductors
81.16.Dn Self-assembly
74.45.+c Proximity effects; Andreev reflection; SN and SNS junctions
81.65.Cf Surface cleaning, etching, patterning
81.16.Nd Micro- and nanolithography
81.15.Cd Deposition by sputtering
68.55.A- Nucleation and growth
68.55.-a Thin film structure and morphology
61.46.-w Structure of nanoscale materials
81.15.Fg Pulsed laser ablation deposition
81.16.Mk Laser-assisted deposition
68.35.B- Structure of clean surfaces (and surface reconstruction)
74.25.F- Transport properties
68.37.Ps Atomic force microscopy (AFM)
68.37.Hk Scanning electron microscopy (SEM) (including EBIC)

Fast analysis of gases in the submillimeter∕terahertz with “absolute” specificity

Ivan R. Medvedev, Markus Behnke, and Frank C. De Lucia

Appl. Phys. Lett. 86, 154105 (2005); http://dx.doi.org/10.1063/1.1897442 (3 pages) | Cited 11 times

Online Publication Date: 5 April 2005

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A submillimeter∕terahertz point detector for gas monitoring and quantification is described. It is based upon the fast ( ∼ 15 GHz/s) sweeping of high spectral purity (<1/107), high brightness ( ∼ 1014 K) microwave sources and a scanning electronic reference for frequency measurement. This approach can quantify the complex rotational spectrum of gases at a rate of ∼ 105 spectral resolution elements∕second at high signal to noise. This resolution and the uniqueness of Doppler limited rotational spectra provide “absolute” specificity and “zero” false alarm rates even in complex mixtures. Moreover, the small size, low power consumption, and the potential of very low cost make this approach attractive for a number of important applications.
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07.07.Df Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing
82.80.Ha Analytical methods involving rotational spectroscopy
07.57.Pt Submillimeter wave, microwave and radiowave spectrometers; magnetic resonance spectrometers, auxiliary equipment, and techniques
78.70.Gq Microwave and radio-frequency interactions

Collapse of stamps for soft lithography due to interfacial adhesion

K. J. Hsia, Y. Huang, E. Menard, J.-U. Park, W. Zhou, J. Rogers, and J. M. Fulton

Appl. Phys. Lett. 86, 154106 (2005); http://dx.doi.org/10.1063/1.1900303 (3 pages) | Cited 38 times

Online Publication Date: 6 April 2005

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Collapse of elastomeric elements used for pattern transfer in soft lithography is studied through experimental measurements and theoretical modeling. The objective is to identify the driving force for such collapse. Two potential driving forces, the self-weight of the stamp and the interfacial adhesion, are investigated. An idealized configuration of periodic rectangular grooves and flat punches is considered. Experimental observations demonstrate that groove collapse occurs regardless of whether the gravitational force promotes or suppresses such collapse, indicating that self-weight is not the driving force. On the other hand, model predictions based on the postulation that interfacial adhesion is the driving force exhibit excellent agreement with the experimentally measured collapse behavior. The interfacial adhesion energy is also evaluated by matching an adhesion parameter in the model with the experimental data.
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81.16.Rf Micro- and nanoscale pattern formation
81.05.Lg Polymers and plastics; rubber; synthetic and natural fibers; organometallic and organic materials
68.35.Md Surface thermodynamics, surface energies
68.35.Np Adhesion
85.40.Hp Lithography, masks and pattern transfer

Cooling to 208 K by optical refrigeration

J. Thiede, J. Distel, S. R. Greenfield, and R. I. Epstein

Appl. Phys. Lett. 86, 154107 (2005); http://dx.doi.org/10.1063/1.1900951 (3 pages) | Cited 36 times

Online Publication Date: 6 April 2005

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We report cooling to record low temperatures by optical refrigeration with ytterbium-doped zirconium–barium–lanthanum–aluminum–sodium-fluoride glass. The glass cooling element was mounted in vacuum in a low-thermal-emissivity chamber and pumped with the light from a diode-pumped solid state Yb:YAG (ytterbium-doped yttrium-aluminum-garnet) laser. Starting from room temperature, the glass cooling element reached a minimum temperature of ∼ 208 K when pumped with ∼ 10 W of 1026-nm light. The heat load at minimum temperature was ∼ 29 mW.
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42.62.-b Laser applications
42.70.Ce Glasses, quartz
07.20.Mc Cryogenics; refrigerators, low-temperature detectors, and other low-temperature equipment
37.10.Vz Mechanical effects of light on atoms, molecules, and ions

Measurement of the mean inner potential of ZnO nanorods by transmission electron holography

E. Müller, P. Kruse, D. Gerthsen, M. Schowalter, A. Rosenauer, D. Lamoen, R. Kling, and A. Waag

Appl. Phys. Lett. 86, 154108 (2005); http://dx.doi.org/10.1063/1.1901820 (3 pages) | Cited 2 times

Online Publication Date: 6 April 2005

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The mean inner potential of ZnO was measured by means of electron holography in a transmission electron microscope. Accurate measurements of the mean inner potential by transmission electron holography are often hampered by imprecise knowledge of the sample thickness. To overcome this problem, ZnO nanorods with a well-defined geometry and diameter were used in our study. Holograms were taken under kinematical diffraction conditions using high-resolution transmission electron microscopy images for magnification calibration. The phase shift of the transmitted beam of the image wave with respect to the reference wave traveling through the vacuum yields the mean inner potential which was determined to be (15.9±1.5) V for ZnO.
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61.46.-w Structure of nanoscale materials
42.40.Lx Diffraction efficiency, resolution, and other hologram characteristics
68.37.Lp Transmission electron microscopy (TEM)
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