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17 Jan 2005

Volume 86, Issue 3, Articles (03xxxx)

Issue Cover Spotlight Figure

Appl. Phys. Lett. 86, 033101 (2005); http://dx.doi.org/10.1063/1.1851002 (3 pages)

Kun Chen, Allen Taflove, Young L. Kim, and Vadim Backman
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Thermal characterization of liquids and polymer thin films using a microcalorimeter

Yuyan Zhang and Srinivas Tadigadapa

Appl. Phys. Lett. 86, 034101 (2005); http://dx.doi.org/10.1063/1.1850186 (3 pages) | Cited 13 times

Online Publication Date: 7 January 2005

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This paper presents an integrated microfluidic thermal sensor that can be used to characterize the thermal properties of nanoliter quantities of fluids and polymer thin films. The device consists of a polycrystalline silicon (polysilicon) heater located in close proximity to the hot junctions of p+-polysilicon/gold microthermopiles fabricated on a thermally isolated membrane. ac calorimetric measurements were performed by introducing a periodic heat signal using the heater and detecting the frequency-dependent thermal signal response in the presence of various fluids and polymers. The thermal conductivity of different fluids and five typical polymers used in microfabrication was measured using this device.
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07.20.Fw Calorimeters
07.20.Dt Thermometers
07.07.Df Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing
07.10.Cm Micromechanical devices and systems
85.85.+j Micro- and nano-electromechanical systems (MEMS/NEMS) and devices
66.70.-f Nonelectronic thermal conduction and heat-pulse propagation in solids; thermal waves
66.25.+g Thermal conduction in nonmetallic liquids

Reconstruction of refractive index discontinuities from truncated phase-contrast tomography projections

Daxin Shi, Mark A. Anastasio, and Xiaochuan Pan

Appl. Phys. Lett. 86, 034102 (2005); http://dx.doi.org/10.1063/1.1852093 (3 pages) | Cited 3 times

Online Publication Date: 7 January 2005

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Propagation-based phase-contrast tomography is a noninterferometric imaging technique that can reconstruct the complex refractive index distribution of an object. To accomplish such a reconstruction using existing methods, however, there must be no truncation of the phase-contrast projection data in the detector planes at each tomographic view angle. We demonstrate that local tomography reconstruction theory can be applied for reconstruction of refractive index discontinuities in two-dimensional objects from truncated phase-contrast projections acquired in the near-Fresnel zone. Numerical results are presented to corroborate our theoretical assertions.
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42.30.Wb Image reconstruction; tomography
78.20.Ci Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)

True-molecular resolution imaging by frequency modulation atomic force microscopy in various environments

Takeshi Fukuma, Takashi Ichii, Kei Kobayashi, Hirofumi Yamada, and Kazumi Matsushige

Appl. Phys. Lett. 86, 034103 (2005); http://dx.doi.org/10.1063/1.1852721 (3 pages) | Cited 28 times

Online Publication Date: 7 January 2005

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In this study, we discuss the relationship between Q factor of the cantilever in various environments and frequency noise in frequency modulation atomic force microscopy (FM-AFM). We first present true-molecular resolution FM-AFM images of alkanethiol self-assembled monolayers taken in a moderate vacuum environment (vacuum pressure: 6 Pa) and in air (cantilever Q factor: 390) using FM-AFM with a low noise cantilever deflection sensor. The results reveal that the minimum Q factor to obtain true-molecular resolution in FM-AFM can be less than a few hundred.
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68.35.B- Structure of clean surfaces (and surface reconstruction)
68.37.Ps Atomic force microscopy (AFM)

Thermal lens spectroscopy of Nd:YAG

C. Jacinto, A. A. Andrade, T. Catunda, S. M. Lima, and M. L. Baesso

Appl. Phys. Lett. 86, 034104 (2005); http://dx.doi.org/10.1063/1.1852084 (3 pages) | Cited 15 times

Online Publication Date: 11 January 2005

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In this work, the thermal lens (TL) spectrometry was performed as a spectroscopic experiment. The spectrum of heat generated by the Nd3+:YAG sample was obtained by continuously tuning a Ti:sapphire laser used as excitation beam. Besides the information about nonradiative efficiency, absolute values of fluorescence quantum efficiency and ds/dT were determined through the multiwavelength TL method by using six discrete excitation wavelengths (514, 588, 739, 808, 817, and 869 nm). The pumping and fluorescence quantum efficiencies of Nd3+ metastable state (math) was observed to be constant throughout the range of excitation wavelengths used. For low doping levels (<0.75 at. % of Nd3+), the effective quantum efficiency is over 93%.
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82.80.Dx Analytical methods involving electronic spectroscopy
81.70.Fy Nondestructive testing: optical methods

Growth mechanisms of highly mismatched AlSb on a Si substrate

G. Balakrishnan, S. Huang, L. R. Dawson, Y.-C. Xin, P. Conlin, and D. L. Huffaker

Appl. Phys. Lett. 86, 034105 (2005); http://dx.doi.org/10.1063/1.1850611 (3 pages) | Cited 23 times

Online Publication Date: 13 January 2005

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We describe the growth mechanisms of highly mismatched (Δao/ao = 13%) defect-free AlSb on Si(001) substrates. Nucleation occurs during the first few monolayers of AlSb deposition by crystalline quantum dot formation. With continued growth, the islands coalesce into a bulk material with no vertically propagating defects. Strain energy from the AlSb/Si interface is dissipated by crystallographic undulations in the zinc-blende lattice, as confirmed by high-resolution transmission electron microscopy (TEM) images. Reciprocal space analysis of the TEM images corroborates a crystallographic rotation associated with the undulations. The resulting AlSb material is >98% relaxed according to x-ray diffraction analysis.
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81.05.Ea III-V semiconductors
81.07.Ta Quantum dots
68.65.Hb Quantum dots (patterned in quantum wells)
81.15.-z Methods of deposition of films and coatings; film growth and epitaxy
68.35.B- Structure of clean surfaces (and surface reconstruction)
68.37.Lp Transmission electron microscopy (TEM)

A mechanical microscope: High-speed atomic force microscopy

A. D. L. Humphris, M. J. Miles, and J. K. Hobbs

Appl. Phys. Lett. 86, 034106 (2005); http://dx.doi.org/10.1063/1.1855407 (3 pages) | Cited 92 times

Online Publication Date: 14 January 2005

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An atomic force microscope capable of obtaining images in less than 20 ms is presented. By utilizing a microresonator as a scan stage, and through the implementation of a passive mechanical feedback loop with a bandwidth of more than 2 MHz, a 1000-fold increase in image acquisition rate relative to a conventional atomic force microscope is obtained. This has allowed images of soft crystalline and molten polymer surfaces to be collected in 14.3 ms, with a tip velocity of 22.4 cm s−1 while maintaining nanometer resolution.
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07.79.Lh Atomic force microscopes
07.10.Cm Micromechanical devices and systems
06.30.Bp Spatial dimensions (e.g., position, lengths, volume, angles, and displacements)
61.25.H- Macromolecular and polymers solutions; polymer melts
85.85.+j Micro- and nano-electromechanical systems (MEMS/NEMS) and devices
68.37.Ps Atomic force microscopy (AFM)

Selective surface modification and patterning by a micro-plasma discharge

Jinan Chai, Baoming Li, and Daniel Y. Kwok

Appl. Phys. Lett. 86, 034107 (2005); http://dx.doi.org/10.1063/1.1856131 (3 pages) | Cited 10 times

Online Publication Date: 14 January 2005

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We demonstrate a selective surface patterning method by a micro-plasma discharge. In this method, argon plasma is ignited through a hole of copper clad polyimide microstructure electrodes. We described here experiments in which an octadecanethiol [CH3(CH2)17SH] self-assembled monolayer (SAM) on a gold film is exposed to a microdischarge, followed by immersion of the sample in 16-mercaptohexadecanoic acid solution. The octadecanethiol SAM is desorbed upon Ar plasma exposure, allowing the formation of a second SAM on the damaged region. The spatial resolution in the present experiments is limited by the dimension of microstructure electrodes. The patterned samples are viewed by using optical microscope and scanning electron microscopy. The advantage of this approach is that it is noncontact and eliminates the need of photolithography.
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52.77.-j Plasma applications
82.40.Np Temporal and spatial patterns in surface reactions
81.16.Rf Micro- and nanoscale pattern formation
68.43.Mn Adsorption kinetics
68.55.-a Thin film structure and morphology
68.55.A- Nucleation and growth
68.37.Hk Scanning electron microscopy (SEM) (including EBIC)

Lithographic patterning of nanoparticle films self-assembled from organic solutions by using a water-soluble mask

Oliver Harnack, Isabelle Raible, Akio Yasuda, and Tobias Vossmeyer

Appl. Phys. Lett. 86, 034108 (2005); http://dx.doi.org/10.1063/1.1856700 (3 pages) | Cited 6 times

Online Publication Date: 14 January 2005

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A lithographic technique is described that enables the highly selective patterning of thin films from gold nanoparticles and organic linker molecules, which are formed via repetitive self-assembly from organic solution. The key element of this method is the application of a calcium oxide∕hydroxide mask, which withstands the application of organic solvents during film deposition and which prevents deposition of nanoparticles on protected parts of the substrate. After film assembly the mask is removed by dissolution in water at room temperature. The method was used to pattern chemiresistor-type vapor sensors based on gold nanoparticle∕nonanedithiol films. Comparative experiments with nonpatterned reference sensors reveal that the patterning process does not degrade the sensing properties of the films.
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81.16.Nd Micro- and nanolithography
07.07.Df Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing
07.10.Cm Micromechanical devices and systems
85.85.+j Micro- and nano-electromechanical systems (MEMS/NEMS) and devices
85.40.Hp Lithography, masks and pattern transfer
81.16.Rf Micro- and nanoscale pattern formation
81.16.Dn Self-assembly

Ablation of organic polymers by 46.9-nm-laser radiation

L. Juha, M. Bittner, D. Chvostova, J. Krasa, Z. Otcenasek, A. R. Präg, J. Ullschmied, Z. Pientka, J. Krzywinski, J. B. Pelka, A. Wawro, M. E. Grisham, G. Vaschenko, C. S. Menoni, and J. J. Rocca

Appl. Phys. Lett. 86, 034109 (2005); http://dx.doi.org/10.1063/1.1854741 (3 pages) | Cited 18 times

Online Publication Date: 14 January 2005

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We report results of the exposure of poly(tetrafluoroethylene) -(PTFE), poly(methyl methacrylate) -(PMMA), and polyimide -(PI) to intense 46.9-nm-laser pulses of 1.2-ns-duration at fluences ranging from ∼ 0.1 to ∼ 10 J/cm2. The ablation rates were found to be similar for all three materials, ∼ 80–90 nm/pulse at 1 J/cm2. The results suggest that the ablation of organic polymers induced by intense extreme ultraviolet laser radiation differs from that corresponding to irradiation with longer wavelengths.
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61.82.Pv Polymers, organic compounds
42.62.-b Laser applications
61.80.Ba Ultraviolet, visible, and infrared radiation effects (including laser radiation)
61.41.+e Polymers, elastomers, and plastics
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