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Appl. Phys. Lett. 87, 172102 (2005); http://dx.doi.org/10.1063/1.2112169 (3 pages)

Exciton hopping and nonradiative decay in AlGaN epilayers

K. Kazlauskas1, A. Žukauskas1, G. Tamulaitis1, J. Mickevičius2, M. S. Shur2, R. S. Qhalid Fareed3, J. P. Zhang3, and R. Gaska3

1Institute of Materials Science and Applied Research and Semiconductor Physics Department, Vilnius University, LT-10222 Vilnius, Lithuania
2Department of ECE and CIE, Rensselaer Polytechnic Institute, Troy, New York 12180
3Sensor Electronic Technology, Inc., Columbia, South Carolina 29209

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(Received 21 June 2005; accepted 30 August 2005; published online 17 October 2005)

Monte Carlo simulation of phonon-assisted localized exciton hopping has been employed to describe the photoluminescence linewidth variation with temperature and to reveal band potential profile of ternary AlGaN epilayers with different carrier lifetimes. The lifetimes of 30 and 190 ps were experimentally determined in the layers with AlN buffers grown by conventional metal-organic chemical vapor deposition (MOCVD) and by migration-enhanced MOCVD (MEMOCVD™), respectively. The potential profile in AlGaN is shown to consist of double-scaled fluctuations. Exciton hopping in Al0.26Ga0.74N occurs within the random potential fluctuations (on the scale σ ≈ 19 meV) in isolated low-potential regions with the average localization energy dispersed on the scale Γ ≈ 19 meV. Such a pattern of band potential profile was found to be independent on the growth technique used for the deposition of their AlN buffer layers. This implies that the large difference in carrier lifetimes estimated in the AlGaN epilayers with the same Al content is caused by different densities of nonradiative recombination centers rather than by carrier localization in the potential fluctuations.

© 2005 American Institute of Physics

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KEYWORDS and PACS

PACS

  • 81.05.Ea

    III-V semiconductors

  • 63.20.kk

    Phonon interactions with other quasiparticles

  • 71.35.-y

    Excitons and related phenomena

  • 78.55.Cr

    III-V semiconductors

  • 78.66.Fd

    III-V semiconductors

  • 73.61.Ey

    III-V semiconductors

  • 73.50.Gr

    Charge carriers: generation, recombination, lifetime, trapping, mean free paths

  • 81.15.Gh

    Chemical vapor deposition (including plasma-enhanced CVD, MOCVD, ALD, etc.)

  • 81.15.Kk

    Vapor phase epitaxy; growth from vapor phase

  • 68.55.A-

    Nucleation and growth

ARTICLE DATA

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

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