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Applied Physics Letters / Volume 87 / Issue 19 / LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 87, 191107 (2005); http://dx.doi.org/10.1063/1.2126135 (3 pages)

Characterization of a 90° waveguide bend using near-field scanning optical microscopy

Guangwei Yuan1, Kevin L. Lear1, Matthew D. Stephens2, and David S. Dandy2

1Department of Electrical and Computer Engineering, Colorado State University, Fort Collins, Colorado 80523
2Department of Chemical and Biological Engineering, Colorado State University, Fort Collins, Colorado 80523

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(Received 5 July 2005; accepted 9 September 2005; published online 1 November 2005)

Multiple modes are directly imaged in a silicon nitride waveguide bend using near-field scanning optical microscopy. Since the high order mode attenuates faster than the fundamental mode, a transient interference is observed. Local loss at the bend-to-straight waveguide interface is found and attributed to modal mismatch. The observations are in good agreement with modal calculations using conformal index transformation.

© 2005 American Institute of Physics

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KEYWORDS and PACS

Keywords

waveguide discontinuities, optical waveguides, near-field scanning optical microscopy, silicon compounds, integrated optics, light interference, optical losses

PACS

  • 42.79.Gn

    Optical waveguides and couplers

  • 42.82.Et

    Waveguides, couplers, and arrays

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.2126135

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    G. H. Vander Rhodes, B. B. Goldberg, M. S. Ünlü, S. T. Chu, W. Pan, T. Kaneko, Y. Kokobun, and B. E. Little, Appl. Phys. Lett. 75, 2368 (1999)APPLAB000075000016002368000001.

    S. Bourzeix, J. M. Moison, F. Mignard, F. Barthe, A. C. Borccara, C. Licoppe, B. Mersali, M. Allovon, and A. Bruno, Appl. Phys. Lett. 73, 1035 (1998)APPLAB000073000008001035000001.

    N. F. Van Hulst, M. H. P. Moers, O. F. J. Noordman, R. G. Tack, and F. B. Segerink, Appl. Phys. Lett. 62, 461 (1993)APPLAB000062000005000461000001.


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