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3 Apr 2006

Volume 88, Issue 14, Articles (14xxxx)

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Appl. Phys. Lett. 88, 143508 (2006); http://dx.doi.org/10.1063/1.2191448 (3 pages)

R. Chan, M. Feng, N. Holonyak, A. James, and G. Walter
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Erratum: “Terahertz near-field electro-optic probe based on a microresonator” [ Appl. Phys. Lett. 88, 091118 (2006) ]

Oleg Mitrofanov

Appl. Phys. Lett. 88, 149901 (2006); http://dx.doi.org/10.1063/1.2195783 (1 page)

Online Publication Date: 7 April 2006

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Abstract Unavailable
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99.10.Cd Errata
07.57.-c Infrared, submillimeter wave, microwave and radiowave instruments and equipment
85.60.-q Optoelectronic devices
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Erratum: “Thermoelectric figure of merit and maximum power factor in III–V semiconductor nanowires” [ Appl. Phys. Lett. 84, 2652 (2004) ]

N. Mingo

Appl. Phys. Lett. 88, 149902 (2006); http://dx.doi.org/10.1063/1.2192639 (1 page) | Cited 10 times

Online Publication Date: 7 April 2006

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Abstract Unavailable
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99.10.Cd Errata
73.63.Nm Quantum wires
72.20.Pa Thermoelectric and thermomagnetic effects
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Publisher's Note: “Atomically-resolved imaging by frequency-modulation atomic force microscopy using a quartz length-extension resonator”[ Appl. Phys. Lett. 87, 133114 (2005) ]

Toshu An, Toyoaki Eguchi, Kotone Akiyama, and Yukio Hasegawa

Appl. Phys. Lett. 88, 149903 (2006); http://dx.doi.org/10.1063/1.2168156 (1 page)

Online Publication Date: 7 April 2006

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99.10.Fg Publisher's note
68.37.Ps Atomic force microscopy (AFM)
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