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16 Oct 2006

Volume 89, Issue 16, Articles (16xxxx)

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Appl. Phys. Lett. 89, 164101 (2006); http://dx.doi.org/10.1063/1.2362602 (3 pages)

Yen-Wen Lu and Chang-Jin(CJ) Kim
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Erratum: “Green fluorescent organic light-emitting device with external quantum efficiency of nearly 10%” [Appl. Phys. Lett. 89, 063504 (2006)]

Kenji Okumoto, Hiroshi Kanno, Yuji Hamada, Hisakazu Takahashi, and Kenichi Shibata

Appl. Phys. Lett. 89, 169901 (2006); http://dx.doi.org/10.1063/1.2359696 (1 page)

Online Publication Date: 16 October 2006

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Abstract Unavailable
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99.10.Cd Errata
85.60.Jb Light-emitting devices
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Erratum: “Annealing-time dependence in interfacial reaction between poly-Si electrode and HfO2/Si gate stack studied by synchrotron radiation photoemission and x-ray absorption spectroscopy” [Appl. Phys. Lett. 89, 012102 (2006)]

H. Takahashi, J. Okabayashi, S. Toyoda, H. Kumigashira, M. Oshima, K. Ikeda, G. L. Liu, Z. Liu, and K. Usuda

Appl. Phys. Lett. 89, 169902 (2006); http://dx.doi.org/10.1063/1.2364452 (1 page) | Cited 1 time

Online Publication Date: 18 October 2006

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Abstract Unavailable
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99.10.Cd Errata
61.72.Cc Kinetics of defect formation and annealing
73.40.Ns Metal-nonmetal contacts
79.60.Bm Clean metal, semiconductor, and insulator surfaces
78.70.Dm X-ray absorption spectra
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