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14 Aug 2006

Volume 89, Issue 7, Articles (07xxxx)

Issue Cover Spotlight Figure

Appl. Phys. Lett. 89, 073501 (2006); http://dx.doi.org/10.1063/1.2335838 (3 pages)

Ingrid Graz, Martin Kaltenbrunner, Christoph Keplinger, Reinhard Schwödiauer, Siegfried Bauer, Stéphanie P. Lacour, and Sigurd Wagner
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Phase stability of epitaxially grown Ti2AlN thin films

M. Beckers, N. Schell, R. M. S. Martins, A. Mücklich, and W. Möller

Appl. Phys. Lett. 89, 074101 (2006); http://dx.doi.org/10.1063/1.2335681 (3 pages) | Cited 10 times

Online Publication Date: 14 August 2006

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The phase stability of Mn+1AXn phase (M: early transition metal, A: A-group element, and X: C and∕or N) Ti2AlN thin films reactively sputtered onto MgO(111) and Al2O3(0001) substrates has been investigated by in situ x-ray diffraction and Rutherford backscattering. High substrate temperature deposition results in epitaxial Ti2AlN growth with basal planes parallel to the substrate surface. In contrast to reported high thermal stability for bulk Ti–Al–N Mn+1AXn phases in air, Ti2AlN thin films in vacuum decompose already at ∼ 800 °C. The decomposition proceeds by outward Al diffusion and evaporation, followed by detwinning of the as-formed Ti2N atomic layers into cubic TiNx and intermediate phases.
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68.55.Nq Composition and phase identification
68.55.A- Nucleation and growth
81.15.Cd Deposition by sputtering
81.15.Kk Vapor phase epitaxy; growth from vapor phase
82.30.Lp Decomposition reactions (pyrolysis, dissociation, and fragmentation)
66.30.-h Diffusion in solids

Surface cleaning from laser-induced cavitation bubbles

Claus-Dieter Ohl, Manish Arora, Rory Dijkink, Vaibhav Janve, and Detlef Lohse

Appl. Phys. Lett. 89, 074102 (2006); http://dx.doi.org/10.1063/1.2337506 (3 pages) | Cited 33 times

Online Publication Date: 14 August 2006

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When bubbles expand and collapse close to boundaries, a shear flow is generated which is able to remove particles from the surface, thus locally cleaning it. Here the authors demonstrate experimentally with microparticle tracking velocimetry that the strongest forcing of particles occurs during a very brief time interval of the bubble oscillation period. During this interval a jet flow impacts and spreads radially along the surface, thus transporting the particles with it.
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47.55.dr Interactions with surfaces
47.55.dd Bubble dynamics
47.55.dp Cavitation and boiling
47.80.Jk Flow visualization and imaging
47.27.wg Turbulent jets
68.08.Bc Wetting

Bright-field imaging of lattice distortions using x rays

J. M. Yi, J. H. Je, Y. S. Chu, Y. Zhong, Y. Hwu, and G. Margaritondo

Appl. Phys. Lett. 89, 074103 (2006); http://dx.doi.org/10.1063/1.2337528 (2 pages) | Cited 2 times

Online Publication Date: 14 August 2006

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See Also: Erratum

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Can x rays yield bright-field images of crystalline systems similar to those of transmission electron microscopy? So far, the response was negative, but the authors present here a positive case: bright-field x-ray images carrying information both from diffraction/scattering phenomena and from absorption and phase contrast. Specifically, synchrotron x-ray transmission micrographs simultaneously yielded diffraction-based information on strain effects and information on structural inhomogeneities when (0001) 4H-SiC wafers were set for a strong reflection in the Laue geometry. This approach offers interesting advantages with respect to the separate study of strain and inhomogeneity effects for a variety of crystalline systems.
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61.05.cp X-ray diffraction
78.70.Dm X-ray absorption spectra

Silicon dioxide microcantilever with piezoresistive element integrated for portable ultraresoluble gaseous detection

Peng Li, Xinxin Li, Guomin Zuo, Jian Liu, Yuelin Wang, Min Liu, and Dazhong Jin

Appl. Phys. Lett. 89, 074104 (2006); http://dx.doi.org/10.1063/1.2335945 (3 pages) | Cited 11 times

Online Publication Date: 15 August 2006

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Surface-stress sensing microcantilevers with on-chip signal readout are demanded for on-the-spot ultrasensitive biological/chemical detection. For enlarging the bending of the cantilever under surface stress induced by specific reaction, a novel SiO2 cantilever is developed which features much lower Young’s modulus than conventional Si or SiNx cantilevers. Thin single-crystalline-silicon piezoresistors are integrated with the SiO2 cantilevers for electric readout. For improving resolution, the piezoresistors are fully encapsulated by SiO2. Thus, the piezoresistors with SiO2 isolation show much lower leakage-related noise than those with p-n junction isolation. Following the description of microfabrication process, this letter gives the sensing model and discusses the thermal mechanism of the piezoresistive SiO2 cantilever. With a specific self-assembled monolayer functionalized on the cantilever surface, on-chip detection for the vapor of trinitrotoluene is performed with a resolution of about 20 ppt (parts per trillion).
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07.07.Df Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing
07.10.Cm Micromechanical devices and systems

Projective measurement in nuclear magnetic resonance

Jae-Seung Lee and A. K. Khitrin

Appl. Phys. Lett. 89, 074105 (2006); http://dx.doi.org/10.1063/1.2337158 (3 pages) | Cited 5 times

Online Publication Date: 15 August 2006

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See Also: Publisher's Note

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It is demonstrated that nuclear magnetic resonance experiments using pseudopure spin states can give possible outcomes of projective quantum measurement and probabilities of such outcomes. The physical system is a cluster of six dipolar-coupled nuclear spins of benzene in a liquid-crystalline matrix. For this system with the maximum total spin S = 3, the results of measuring SX are presented for the cases when the state of the system is one of the eigenstates of SZ.
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76.60.-k Nuclear magnetic resonance and relaxation

Synthesis of large-scale GaN nanobelts by chemical vapor deposition

Bingshe Xu, Dong Yang, Fei Wang, Jian Liang, Shufang Ma, and Xuguang Liu

Appl. Phys. Lett. 89, 074106 (2006); http://dx.doi.org/10.1063/1.2335623 (3 pages) | Cited 13 times

Online Publication Date: 17 August 2006

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GaN nanobelts were synthesized in mass by direct reaction of metallic gallium with flowing ammonia using nickel as a catalyst. X-ray diffraction, field emission scanning electron microscope equipped with an energy dispersive spectroscopy, and high resolution transmission electron microscopy were used to characterize the products. The results showed that the products are of hexagonal wurtzite structure. The widths of nanobelts were in the range of 50–200 nm with the thickness ranging from 3 to 10 nm and their lengths up to several tens of microns. The catalytic growth mechanism of the GaN nanobelts was also discussed.
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81.15.Gh Chemical vapor deposition (including plasma-enhanced CVD, MOCVD, ALD, etc.)
81.16.Hc Catalytic methods
61.46.Hk Nanocrystals
81.07.Bc Nanocrystalline materials
68.37.Hk Scanning electron microscopy (SEM) (including EBIC)
82.80.Ej X-ray, Mössbauer, and other γ-ray spectroscopic analysis methods

Evaporative cooling in microfluidic channels

George Maltezos, Aditya Rajagopal, and Axel Scherer

Appl. Phys. Lett. 89, 074107 (2006); http://dx.doi.org/10.1063/1.2234318 (3 pages) | Cited 5 times

Online Publication Date: 18 August 2006

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Evaporative cooling is an effective and energy efficient way to rapidly remove heat from a system. Specifically, evaporative cooling in microfluidic channels can provide a cost-effective solution for the cooling of electronic devices and chemical reactors. Here we present microfluidic devices fabricated by using soft-lithography techniques to form simple fluidic junctions between channels carrying refrigerant and channels carrying N2 gas. The effects of channel geometry and delivery pressure on the performance of refrigeration through vaporization of acetone, isopropyl alcohol, and ethyl ether were characterized. By varying gas inlet pressures, refrigerants, and angles of the microfluidic junctions, optimal cooling conditions were found. Refrigeration rates in excess of 40 °C/s were measured, and long lasting subzero cooling in the junction could be observed.
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85.85.+j Micro- and nano-electromechanical systems (MEMS/NEMS) and devices
07.20.Mc Cryogenics; refrigerators, low-temperature detectors, and other low-temperature equipment
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