• Volume/Page
  • Keyword
  • DOI
  • Citation
  • Advanced
   
 
 
 

Flickr Twitter iResearch App Facebook

Year Range: 
Search Issue | RSS Feeds RSS
Previous Issue Next Issue

10 Sep 2007

Volume 91, Issue 11, Articles (11xxxx)

Issue Cover Spotlight Figure

Appl. Phys. Lett. 91, 112501 (2007); http://dx.doi.org/10.1063/1.2780107 (3 pages)

Y. Liu, S. Gliga, R. Hertel, and C. M. Schneider
Page 2 of 5 Pages Previous Page Next Page | Jump to Page
back to top
RSS Feeds

Study of structural transition from metastable zinc blende to rocksalt crystal in molecular beam epitaxy MgS/ZnSe/GaAs multilayer system

L. Nasi, C. Bocchi, A. Catellani, F. Germini, J. K. Morrod, K. A. Prior, and G. Calestani

Appl. Phys. Lett. 91, 111908 (2007); http://dx.doi.org/10.1063/1.2784182 (3 pages) | Cited 3 times

Online Publication Date: 13 September 2007

Full Text: Read Online (HTML) | Download PDF

Show Abstract
The stable crystal structure of magnesium sulfide (MgS) is rocksalt. However, the metastable zinc-blende structure is obtained when MgS is deposited by molecular beam epitaxy (MBE) on (001) zinc-blende substrates with a relatively small misfit. In the present work, the zinc blende to rocksalt phase transition is analyzed in MgS/ZnSe/GaAs multilayer samples grown by MBE with different MgS layer thicknesses. By x-ray diffraction and transmission electron microscopy methods, a partial nucleation of MgS rocksalt is evidenced and correlated to the presence of stacking faults at the bottom interface. The unexpected coexistence of both rocksalt and zinc-blende MgS structural phases is discussed.
Show PACS
64.70.K- Solid-solid transitions
68.55.-a Thin film structure and morphology
68.55.Nq Composition and phase identification

Slow electromagnetic propagation with low group velocity dispersion in an all-metamaterial-based waveguide

J. W. Dong and H. Z. Wang

Appl. Phys. Lett. 91, 111909 (2007); http://dx.doi.org/10.1063/1.2784201 (3 pages) | Cited 10 times

Online Publication Date: 13 September 2007

Full Text: Read Online (HTML) | Download PDF

Show Abstract
The authors found that zero group velocity exists in a two-dimensional planar waveguide consisting of a left-handed metamaterial core and two identical claddings with negative permittivity. The mechanism is realized in a waveguide guiding a vortex mode, which results in the cancellation of the power flows between the core and the claddings. Moreover, by varying the waveguide thickness, the authors can manipulate the pulse velocity in the slow-light regime while simultaneously minimizing the pulse distortion. In addition, issues associated with energy loss are discussed.
Show PACS
42.79.Gn Optical waveguides and couplers
42.82.Et Waveguides, couplers, and arrays

Chemical phase transitions of a Si oxide film on SiC by MeV electron beam irradiation

C. Jeon, J. H. Nam, W. Song, C.-Y. Park, J. R. Ahn, M.-C. Jung, H. J. Shin, Y. H. Han, and B. C. Lee

Appl. Phys. Lett. 91, 111910 (2007); http://dx.doi.org/10.1063/1.2783483 (3 pages) | Cited 2 times

Online Publication Date: 13 September 2007

Full Text: Read Online (HTML) | Download PDF

Show Abstract
An ultrathin Si oxide film grown on a 6H-SiC(0001) wafer was irradiated with 1 MeV electron beam to examine its effect on the chemical species of a Si oxide/SiC wafer, where the Si oxide film was composed of SiO2, Si suboxides (Si3+, Si2+, and Si1+), and Si oxycarbides (Si–C–O). Scanning photoelectron microscopy and Si 2p core-level spectroscopy show that e-beam irradiation induces chemical phase transitions from the Si suboxides and Si oxycarbides to SiO2. This suggests that e-beam irradiation is an efficient and simple method of producing a chemically uniform SiO2 film on SiC without thermal and chemical treatments.
Show PACS
61.80.Fe Electron and positron radiation effects
61.82.Ms Insulators
82.30.-b Specific chemical reactions; reaction mechanisms

Load induced stresses and plastic deformation in 450 mm silicon wafers

A. Fischer and G. Kissinger

Appl. Phys. Lett. 91, 111911 (2007); http://dx.doi.org/10.1063/1.2784964 (3 pages) | Cited 4 times

Online Publication Date: 13 September 2007

Full Text: Read Online (HTML) | Download PDF

Show Abstract
The authors present the physical basis for estimation of gravitational constraints in 450 mm silicon wafers subjected to high temperature processes. They have identified and quantified the relevant phenomena to predict the mechanical behavior of very large silicon wafers horizontally stacked and ring- or pointlike supported in a vertical-type furnace. It is shown that load induced stress at the supports increases directly proportional with increasing wafer diameter, although the weight of the wafer increases with the square of diameter. The results allow the optimization for a defect-free high temperature treatment of 450 mm wafer used for leading edge device fabrication in future.
Show PACS
81.05.Cy Elemental semiconductors
81.40.Lm Deformation, plasticity, and creep
81.40.Jj Elasticity and anelasticity, stress-strain relations
81.40.Gh Other heat and thermomechanical treatments
62.20.F- Deformation and plasticity
62.20.D- Elasticity

Self-written gradient double claddlike optical guiding channels of high stability

Armen Zohrabyan, Amir Tork, Rouslan Birabassov, and Tigran Galstian

Appl. Phys. Lett. 91, 111912 (2007); http://dx.doi.org/10.1063/1.2770775 (3 pages) | Cited 7 times

Online Publication Date: 14 September 2007

Full Text: Read Online (HTML) | Download PDF

Show Abstract
Composite photopolymerizable material and self-writing method are developed, allowing the creation of very stable (in time) gradient double-clad optical waveguides with W form of refractive index profile. The guide is formed by the mutual counter diffusion of reactive and nonreactive molecules followed by photopolymerization. After the guide formation by a Gaussian intensity shaped beam, the mixture is simply fixed by uniform irradiation without additional processing. More than 2 cm length permanent self-guiding channels are created. The obtained results could be useful for “optical bonding” of dissimilar optical devices.
Show PACS
42.79.Gn Optical waveguides and couplers
42.70.Jk Polymers and organics
42.62.-b Laser applications

The role of hydrostatic stress in determining the bandgap of InN epilayers

Abdul Kadir, Tapas Ganguli, Ravi Kumar, M. R. Gokhale, A. P. Shah, Sandip Ghosh, B. M. Arora, and Arnab Bhattacharya

Appl. Phys. Lett. 91, 111913 (2007); http://dx.doi.org/10.1063/1.2784199 (3 pages) | Cited 10 times

Online Publication Date: 14 September 2007

Full Text: Read Online (HTML) | Download PDF

Show Abstract
This letter establishes a correlation between the internal stress in InN epilayers and their optical properties such as the measured absorption band edge and photoluminescence emission wavelength. By a careful evaluation of the lattice constants of InN epilayers grown on c-plane sapphire substrates under various conditions by metalorganic vapor phase epitaxy, the authors find that the films are under primarily hydrostatic strain. The corresponding stress results in a shift in the band edge to higher energy. The effect is significant and may be responsible for some of the variations in InN bandgap reported in the literature.
Show PACS
78.66.Fd III-V semiconductors
78.20.Ci Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)
78.55.Cr III-V semiconductors
71.20.Nr Semiconductor compounds
68.60.Bs Mechanical and acoustical properties
68.55.-a Thin film structure and morphology

Slip transfer through a general high angle grain boundary in nanocrystalline aluminum

C. Brandl, E. Bitzek, P. M. Derlet, and H. Van Swygenhoven

Appl. Phys. Lett. 91, 111914 (2007); http://dx.doi.org/10.1063/1.2784939 (3 pages) | Cited 8 times

Online Publication Date: 14 September 2007

Full Text: Read Online (HTML) | Download PDF

Show Abstract
The atomistic details of a slip transfer through a general high angle grain boundary in three dimensional nanocrystalline Al are reported and discussed in terms of possible implications for mesoscopic simulation models.
Show PACS
61.72.Hh Indirect evidence of dislocations and other defects (resistivity, slip, creep, strains, internal friction, EPR, NMR, etc.)
61.72.Qq Microscopic defects (voids, inclusions, etc.)
61.72.Mm Grain and twin boundaries
61.46.Hk Nanocrystals
62.20.F- Deformation and plasticity

Effects of focused ion beam milling on the nanomechanical behavior of a molybdenum-alloy single crystal

H. Bei, S. Shim, M. K. Miller, G. M. Pharr, and E. P. George

Appl. Phys. Lett. 91, 111915 (2007); http://dx.doi.org/10.1063/1.2784948 (3 pages) | Cited 5 times

Online Publication Date: 14 September 2007

Full Text: Read Online (HTML) | Download PDF

Show Abstract
Nanoindentation was performed on a Mo-alloy single crystal to investigate effects of focused ion beam (FIB) milling on mechanical behavior. On a non-FIB-milled surface, pop-ins were observed on all load-displacement curves corresponding to a transition from elastic to plastic deformation. Similar pop-ins were not detected on surfaces subjected to FIB milling. This difference indicates that FIB milling introduces damage that obviates the need for dislocation nucleation during subsequent deformation. A second effect of FIB milling is that it increased the surface hardness. Together, these effects could be the source of the size effects reported in the literature on micropillar tests.
Show PACS
81.05.Bx Metals, semimetals, and alloys
61.80.Jh Ion radiation effects
61.72.Hh Indirect evidence of dislocations and other defects (resistivity, slip, creep, strains, internal friction, EPR, NMR, etc.)
81.40.Np Fatigue, corrosion fatigue, embrittlement, cracking, fracture, and failure
68.35.Gy Mechanical properties; surface strains
64.60.Q- Nucleation

Characteristic optical properties of transparent color conversion film prepared from YAG:Ce3+ nanoparticles

R. Kasuya, A. Kawano, T. Isobe, H. Kuma, and J. Katano

Appl. Phys. Lett. 91, 111916 (2007); http://dx.doi.org/10.1063/1.2785131 (3 pages) | Cited 36 times

Online Publication Date: 14 September 2007

Full Text: Read Online (HTML) | Download PDF

Show Abstract
The authors produced the transparent color conversion thick film which is composed of a high concentration of YAG:Ce3+ nanoparticles prepared by glycothermal method, and characterized its optical properties. The transmittance of the 200 μm thick film with the nanoparticle content 70.7 wt % was 82% at 525 nm corresponding to the emission peak of YAG:Ce3+. The intensity of photoluminescence due to the 5d→4f transition of Ce3+ in YAG:Ce3+ nanoparticles was doubled by placing a reflection mirror at the back of the transparent film. Judging from this result, the transparent film of YAG:Ce3+ nanoparticles has markedly low scattering loss.
Show PACS
78.66.Nk Insulators
78.67.Bf Nanocrystals, nanoparticles, and nanoclusters
78.55.Hx Other solid inorganic materials
78.20.Ci Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)
75.50.Gg Ferrimagnetics

Experimental and theoretical studies of lattice dynamics of Mg-doped InN

V. Yu. Davydov, A. A. Klochikhin, M. B. Smirnov, A. N. Smirnov, I. N. Goncharuk, D. A. Kurdyukov, Hai Lu, William J. Schaff, H.-M. Lee, H.-W. Lin, and S. Gwo

Appl. Phys. Lett. 91, 111917 (2007); http://dx.doi.org/10.1063/1.2785137 (3 pages) | Cited 6 times

Online Publication Date: 14 September 2007

Full Text: Read Online (HTML) | Download PDF

Show Abstract
Raman studies of Mg-doped InN films with a Mg content from NMg = 3.3×1019 to 5.5×1021 cm−3 are reported. Raman and secondary ion mass spectroscopy data on the Mg content have been found to correlate well. Lattice dynamics of hexagonal InN with substitutional impurities and vacancies has been investigated in the framework of the cluster approach. Energy positions of local vibrational modes in InN have been calculated and compared with experimental findings. It is concluded that Raman spectroscopy is a good tool for quantitative characterization of Mg-doped InN.
Show PACS
63.20.-e Phonons in crystal lattices
78.66.Fd III-V semiconductors
78.30.Fs III-V and II-VI semiconductors
79.20.Rf Atomic, molecular, and ion beam impact and interactions with surfaces
61.72.J- Point defects and defect clusters

Spectral characterization of transparent (Nd0.01Y0.94La0.05)2O3 laser ceramics

Qiuhong Yang, C. G. Dou, J. Ding, X. M. Hu, and J. Xu

Appl. Phys. Lett. 91, 111918 (2007); http://dx.doi.org/10.1063/1.2785151 (2 pages) | Cited 10 times

Online Publication Date: 14 September 2007

Full Text: Read Online (HTML) | Download PDF

Show Abstract
The spectrum properties of transparent (Nd0.01Y0.94La0.05)2O3 ceramics were investigated. It was found that all absorption bands of (Nd0.01Y0.94La0.05)2O3 ceramics are broadened, of which the full width at half maximum of the peak centered at 804 nm is 8 nm and its absorption cross section is 1.02×10−20 cm2. The emission cross section of (Nd0.01Y0.94La0.05)2O3 ceramics located at 1078 nm is 5.71×10−20 cm2 and its fluorescent lifetime is 0.214 ms, which are similar to those of 1.0 at. %Nd:Y2O3 ceramics. These indicate that (Nd0.01Y0.94La0.05)2O3 transparent ceramics has excellent spectroscopic properties.
Show PACS
78.20.Ci Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)
78.30.Hv Other nonmetallic inorganics
78.55.Hx Other solid inorganic materials
42.70.Hj Laser materials

Yield stress of monocrystalline rhenium nanowires

L. Philippe, I. Peyrot, J. Michler, A. W. Hassel, and S. Milenkovic

Appl. Phys. Lett. 91, 111919 (2007); http://dx.doi.org/10.1063/1.2785153 (3 pages) | Cited 10 times

Online Publication Date: 14 September 2007

Full Text: Read Online (HTML) | Download PDF

Show Abstract
The yield stress of monocrystalline Rhenium nanowires grown by directional solidification was measured by nanobending testing. The average yield stress calculated from the deflection was between 10 and 60 GPa, which represents roughly 10% of the rhenium Young modulus along the nanowire’s direction. Analytical results are compared to the ones obtained with a more complex finite element simulation. Origins of the experimental observed yield stress values variations are discussed in terms of experimental measurement errors, elastic anisotropy, and the presence of an oxide layer on the nanowire surface.
Show PACS
81.07.Bc Nanocrystalline materials
81.40.Lm Deformation, plasticity, and creep
81.30.Fb Solidification
81.40.Jj Elasticity and anelasticity, stress-strain relations
62.20.F- Deformation and plasticity
61.46.Hk Nanocrystals
back to top
RSS Feeds

Field-programmable rectification in rutile TiO2 crystals

John R. Jameson, Yoshiaki Fukuzumi, Zheng Wang, Peter Griffin, Koji Tsunoda, G. Ingmar Meijer, and Yoshio Nishi

Appl. Phys. Lett. 91, 112101 (2007); http://dx.doi.org/10.1063/1.2769961 (3 pages) | Cited 40 times

Online Publication Date: 10 September 2007

Full Text: Read Online (HTML) | Download PDF

Show Abstract
The authors report “field-programmable rectification” in crystals of rutile TiO2. A “programming” voltage is applied between two Pt electrodes on the surface of a crystal. Afterwards, current can pass in the direction of the programming voltage, but not in the reverse direction. The polarity of the rectification can be reversed by applying a programming voltage of opposite sign. The effect was observed on the (110) and (100) surfaces, but not the (001) surface. The proposed mechanism is field-induced motion of oxygen vacancies, which pile up under the negative terminal, eliminating a Schottky barrier, but leaving one at the positive terminal intact.
Show PACS
73.40.Ei Rectification
73.30.+y Surface double layers, Schottky barriers, and work functions

Lateral electron tunneling through single self-assembled InAs quantum dots coupled to superconducting nanogap electrodes

Kenji Shibata, Christo Buizert, Akira Oiwa, Kazuhiko Hirakawa, and Seigo Tarucha

Appl. Phys. Lett. 91, 112102 (2007); http://dx.doi.org/10.1063/1.2779970 (3 pages) | Cited 10 times

Online Publication Date: 10 September 2007

Full Text: Read Online (HTML) | Download PDF

Show Abstract
The authors have fabricated superconductor-quantum dot-superconductor (SC-QD-SC) junctions by using SC aluminum electrodes with narrow gaps laterally contacting a single self-assembled InAs QD. The fabricated junctions exhibited clear Coulomb staircases and Coulomb oscillations at 40 mK. Furthermore, clear suppression in conductance was observed for the source-drain voltage, VSD∣<2Δ/e, where Δ is the SC energy gap of Al. The absence of Josephson current that flows through QDs is due to the strong Coulomb interaction and non-negligible thermal fluctuation in our measurement system.
Show PACS
73.63.Kv Quantum dots
74.50.+r Tunneling phenomena; Josephson effects
74.25.Jb Electronic structure (photoemission, etc.)
74.70.Ad Metals; alloys and binary compounds (including A15, MgB2, etc.)

X-ray photoemission spectroscopy determination of the InN/yttria stabilized cubic-zirconia valence band offset

P. D. C. King, T. D. Veal, S. A. Hatfield, P. H. Jefferson, C. F. McConville, C. E. Kendrick, C. H. Swartz, and S. M. Durbin

Appl. Phys. Lett. 91, 112103 (2007); http://dx.doi.org/10.1063/1.2783214 (3 pages) | Cited 6 times

Online Publication Date: 10 September 2007

Full Text: Read Online (HTML) | Download PDF

Show Abstract
The valence band offset of wurtzite InN(0001)/yttria stabilized cubic-zirconia (YSZ)(111) heterojunctions is determined by x-ray photoemission spectroscopy to be 1.19±0.17 eV giving a conduction band offset of 3.06±0.20 eV. Consequently, a type-I heterojunction forms between InN and YSZ in the straddling arrangement. The low lattice mismatch and high band offsets suggest potential for use of YSZ as a gate dielectric in high-frequency InN-based electronic devices.
Show PACS
79.60.Bm Clean metal, semiconductor, and insulator surfaces
73.40.Kp III-V semiconductor-to-semiconductor contacts, p-n junctions, and heterojunctions
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

Direct-current control of radiation-induced differential magnetoresistance oscillations in two-dimensional electron systems

X. L. Lei

Appl. Phys. Lett. 91, 112104 (2007); http://dx.doi.org/10.1063/1.2783260 (3 pages) | Cited 10 times

Online Publication Date: 10 September 2007

Full Text: Read Online (HTML) | Download PDF

Show Abstract
Magnetoresistance oscillations in two-dimensional electron systems driven simultaneously by a strong direct current and a microwave irradiation are analyzed within a unified microscopic scheme treating both excitations on an equal footing. The microwave-induced resistance oscillations are described by a parameter ϵω proportional to the radiation frequency, while the dc-induced resistance oscillations are governed by a parameter ϵj proportional to the current density. In the presence of both a microwave radiation and a strong dc, the combined parameter ϵω+ϵj is shown to control the main resistance oscillations, in agreement with the recent measurement [ Zhang et al., Phys. Rev. Lett. 98, 106804 (2007) ].
Show PACS
72.20.My Galvanomagnetic and other magnetotransport effects
73.63.-b Electronic transport in nanoscale materials and structures

Effective work function modulation of TaN metal gate on HfO2 after postmetallization annealing

Youhei Sugimoto, Masanari Kajiwara, Keisuke Yamamoto, Yuusaku Suehiro, Dong Wang, and Hiroshi Nakashima

Appl. Phys. Lett. 91, 112105 (2007); http://dx.doi.org/10.1063/1.2783472 (3 pages) | Cited 12 times

Online Publication Date: 10 September 2007

Full Text: Read Online (HTML) | Download PDF

Show Abstract
The effective work function m,eff) of TaN on HfO2 after postmetallization annealing (PMA) was investigated using TaN/HfO2/SiO2/Si as a sample structure. We found that Φm,eff on HfO2 is stable at PMA temperatures of less than 600 °C and is 4.6 eV, which is approximately 0.2 eV higher than that on SiO2. In contrast, Φm,eff is modulated by PMA at temperatures greater than 750 °C. An analysis by x-ray photoelectron spectroscopy suggests that the increased Φm,eff is strongly related to Ta oxide formation near the TaN/HfO2 interface. The modulation of Φm,eff on HfO2 is discussed on the basis of intrinsic and extrinsic Fermi level pinning due to Ta–O bond formation at the TaN/HfO2 interface.
Show PACS
73.30.+y Surface double layers, Schottky barriers, and work functions
77.55.-g Dielectric thin films
81.40.Gh Other heat and thermomechanical treatments
68.35.Ct Interface structure and roughness
73.20.At Surface states, band structure, electron density of states
85.40.-e Microelectronics: LSI, VLSI, ULSI; integrated circuit fabrication technology

Prostate specific antigen detection using AlGaN/GaN high electron mobility transistors

B. S. Kang, H. T. Wang, T. P. Lele, Y. Tseng, F. Ren, S. J. Pearton, J. W. Johnson, P. Rajagopal, J. C. Roberts, E. L. Piner, and K. J. Linthicum

Appl. Phys. Lett. 91, 112106 (2007); http://dx.doi.org/10.1063/1.2772192 (3 pages) | Cited 19 times

Online Publication Date: 11 September 2007

Full Text: Read Online (HTML) | Download PDF

Show Abstract
Antibody-functionalized Au-gated AlGaN/GaN high electron mobility transistors (HEMTs) were used to detect prostate specific antigen (PSA). The PSA antibody was anchored to the gate area through the formation of carboxylate succinimdyl ester bonds with immobilized thioglycolic acid. The AlGaN/GaN HEMT drain-source current showed a rapid response of less than 5 s when target PSA in a buffer at clinical concentrations was added to the antibody-immobilized surface. The authors could detect a wide range of concentrations from 10 pg/ml to 1 μg/ml. The lowest detectable concentration was two orders of magnitude lower than the cutoff value of PSA measurements for clinical detection of prostate cancer. These results clearly demonstrate the promise of portable electronic biological sensors based on AlGaN/GaN HEMTs for PSA screening.
Show PACS
87.80.-y Biophysical techniques (research methods)
85.30.Tv Field effect devices
87.19.X- Diseases

Excellent passivation of highly doped p-type Si surfaces by the negative-charge-dielectric Al2O3

B. Hoex, J. Schmidt, R. Bock, P. P. Altermatt, M. C. M. van de Sanden, and W. M. M. Kessels

Appl. Phys. Lett. 91, 112107 (2007); http://dx.doi.org/10.1063/1.2784168 (3 pages) | Cited 52 times

Online Publication Date: 11 September 2007

Full Text: Read Online (HTML) | Download PDF

Show Abstract
From lifetime measurements, including a direct experimental comparison with thermal SiO2, a-Si:H, and as-deposited a-SiNx:H, it is demonstrated that Al2O3 provides an excellent level of surface passivation on highly B-doped c-Si with doping concentrations around 1019 cm−3. The Al2O3 films, synthesized by plasma-assisted atomic layer deposition and with a high fixed negative charge density, limit the emitter saturation current density of B-diffused p+-emitters to ∼ 10 and ∼ 30 fA/cm2 on >100 and 54 Ω/sq sheet resistance p+-emitters, respectively. These results demonstrate that highly doped p-type Si surfaces can be passivated as effectively as highly doped n-type surfaces.
Show PACS
81.65.Rv Passivation
77.84.Bw Elements, oxides, nitrides, borides, carbides, chalcogenides, etc.
77.55.-g Dielectric thin films
61.72.S- Impurities in crystals
84.60.Jt Photoelectric conversion

Altering low-bias transport in zigzag-edge graphene nanostrips with edge chemistry

D. Gunlycke, J. Li, J. W. Mintmire, and C. T. White

Appl. Phys. Lett. 91, 112108 (2007); http://dx.doi.org/10.1063/1.2783196 (3 pages) | Cited 42 times

Online Publication Date: 12 September 2007

Full Text: Read Online (HTML) | Download PDF

Show Abstract
Zigzag-edge graphene nanostrips could be terminated with a variety of atoms or functional groups. Presented local-density-functional calculations show that these different species have a significant impact on the electronic structure of these strips near the Fermi level. The terminations covered include hydrogen and oxygen atoms as well as hydroxyl and imine groups. Zigzag-edge nanostrips terminated with hydrogen atoms or hydroxyl groups exhibit spin polarization in equilibrium, while the nanostrips terminated with oxygen or imine groups are unpolarized, leading to much different low-bias transport properties.
Show PACS
73.63.-b Electronic transport in nanoscale materials and structures
72.25.-b Spin polarized transport
71.20.Mq Elemental semiconductors
71.15.Mb Density functional theory, local density approximation, gradient and other corrections

Boron-doped a-Si:H/c-Si interface passivation: Degradation mechanism

Stefaan De Wolf and Michio Kondo

Appl. Phys. Lett. 91, 112109 (2007); http://dx.doi.org/10.1063/1.2783972 (3 pages) | Cited 15 times

Online Publication Date: 12 September 2007

Full Text: Read Online (HTML) | Download PDF

Show Abstract
The authors report that for a-Si:H/c-Si heterostructure solar cell fabrication the presence of a boron-doped a-Si:H(p+) overlayer may cause H2 effusion from a (few nanometers) thin underlying intrinsic a-Si:H(i) film at moderate temperatures. This phenomenon is in agreement with losses in the electronic passivation quality of c-Si/a-Si:H(i)/a-Si:H(p+) structures occurring during low temperature ( ⩽ 260 °C) postdeposition annealing. Consequently, it is argued that such passivation degradation is due to Si–H rupture in the a-Si:H(i) film, likely resulting in Si dangling bond defects, mediated by the presence of the doped layer.
Show PACS
81.65.Rv Passivation
84.60.Jt Photoelectric conversion
61.72.Cc Kinetics of defect formation and annealing
71.55.Cn Elemental semiconductors

Donor/acceptor doping and electrical tailoring in ZnO quantum dots

Z. Z. Ye, Y. J. Zeng, Y. F. Lu, S. S. Lin, L. Sun, L. P. Zhu, and B. H. Zhao

Appl. Phys. Lett. 91, 112110 (2007); http://dx.doi.org/10.1063/1.2784198 (3 pages) | Cited 4 times

Online Publication Date: 12 September 2007

Full Text: Read Online (HTML) | Download PDF

Show Abstract
The authors report on donor/acceptor doping in ZnO quantum dots (QDs) grown by a metal-organic chemical vapor deposition method. The Ga donor and N acceptor, as identified by x-ray photoelectron spectroscopy (XPS), are introduced into ZnO QDs. They demonstrate, with a combination of valence band XPS and scanning tunneling microscopy, that the electrical properties as well as Fermi level of the ZnO QDs can be well tuned by the donor/acceptor doping. In addition, photoluminescence from the ZnO QDs with quantum confinement effect is observed.
Show PACS
73.21.La Quantum dots
79.60.Jv Interfaces; heterostructures; nanostructures
78.55.Et II-VI semiconductors
61.72.uj III-V and II-VI semiconductors
73.63.Kv Quantum dots

Control of the electrode work function and active layer morphology via surface modification of indium tin oxide for high efficiency organic photovoltaics

Jong Soo Kim, Jong Hwan Park, Ji Hwang Lee, Jang Jo, Dong-Yu Kim, and Kilwon Cho

Appl. Phys. Lett. 91, 112111 (2007); http://dx.doi.org/10.1063/1.2778548 (3 pages) | Cited 51 times

Online Publication Date: 13 September 2007

Full Text: Read Online (HTML) | Download PDF

Show Abstract
Indium tin oxide (ITO) substrates modified with self-assembled monolayers (SAMs) were used to control the anode work function and active layer morphology of organic solar cells based on poly(3-hexylthiophene)/[6:6]-phenyl-C61 butyric acid methyl ester heterojunctions. By using SAMs with the terminal groups NH2, CH3, and CF3, the authors were able to control the hole injection barrier of the ITO closer to the highest occupied molecular orbital level of active layer and surface energy of the ITO substrate. A solar cell device with CF3 SAM treated ITO was found to exhibit high efficiency performance, about 3.15%.
Show PACS
84.60.Jt Photoelectric conversion

Effective passivation of highly aluminum-doped p-type silicon surfaces using amorphous silicon

Robert Bock, Jan Schmidt, and Rolf Brendel

Appl. Phys. Lett. 91, 112112 (2007); http://dx.doi.org/10.1063/1.2784193 (3 pages) | Cited 10 times

Online Publication Date: 13 September 2007

Full Text: Read Online (HTML) | Download PDF

Show Abstract
Highly aluminum-doped p-type emitters prepared by screen printing on crystalline silicon wafers are effectively passivated by plasma-enhanced chemical-vapor deposited amorphous silicon layers. Using the photoconductance decay technique, the authors measure emitter saturation current densities of 800±200 fA/cm2 for nonpassivated emitters and of 490±120 fA/cm2 for Al-p+ emitters passivated with a 20 nm thick amorphous silicon layer deposited at 225 °C. An additional annealing step at 300 °C for 10 min reduces the emitter saturation current density down to only 246±60 fA/cm2. The measured saturation current densities are the lowest values achieved so far for Al-doped p+ emitter.
Show PACS
85.30.-z Semiconductor devices
85.40.Sz Deposition technology

Growth parameter-property phase diagram for pulsed laser deposited transparent oxide conductor anatase Nb:TiO2

S. X. Zhang, S. Dhar, W. Yu, H. Xu, S. B. Ogale, and T. Venkatesan

Appl. Phys. Lett. 91, 112113 (2007); http://dx.doi.org/10.1063/1.2785152 (3 pages) | Cited 21 times

Online Publication Date: 14 September 2007

Full Text: Read Online (HTML) | Download PDF

Show Abstract
The authors performed a systematic study of the structural and electrical properties of Nb:TiO2 thin films by varying the substrate temperature (TS) and oxygen partial pressure (PO2). Niobium is found to incorporate easily and substitutionally into titanium lattice site as indicated by its low activation energy. By increasing TS, the carrier concentration (n) increases in the same way that niobium substitution fraction (s) increases, and the mobility increases as the structural quality is improved. With increasing PO2, n decreases dramatically though s does not change considerably. This may indicate that a large number of p-type native defects form, which “kill” the electrons produced by the Nb donors.
Show PACS
68.55.-a Thin film structure and morphology
73.61.Ng Insulators
81.15.Fg Pulsed laser ablation deposition
73.50.Dn Low-field transport and mobility; piezoresistance
72.20.Fr Low-field transport and mobility; piezoresistance
Page 2 of 5 Pages Previous Page Next Page | Jump to Page
Close
Google Calendar
ADVERTISEMENT

close