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Appl. Phys. Lett. 91, 192108 (2007); http://dx.doi.org/10.1063/1.2806912 (3 pages)

Self-separated freestanding GaN using a NH4Cl interlayer

Hyun-Jae Lee1, S. W. Lee1, H. Goto1, Sang-Hyun Lee1, Hyo-Jong Lee1, J. S. Ha1, Takenari Goto1, M. W. Cho1, T. Yao1, and Soon-Ku Hong2

1Center for Interdisciplinary Research, Tohoku University, Aramaki, Aoba-ku, Sendai 980-8578, Japan
2School of Nano Science and Technology, Chungnam National University, 220 Gung-dong, Yuseong-gu, Daejeon 305-764, Korea

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(Received 10 May 2007; accepted 18 October 2007; published online 8 November 2007)

Thick GaN films were grown on void buffer layer by hydride vapor phase epitaxy. The void-buffer layers were consisted of NH4Cl, GaN dots, and low-temperature (LT) GaN buffer layer. Instead of GaN, NH4Cl was easily synthesized in NH3 and HCl atmospheres by simply lowering the growth temperature to 500 °C, and LT GaN buffer growth was followed during increasing substrate temperature to 600 °C. The LT GaN buffer acted as a protecting layer against evaporation of the NH4Cl and a seeding layer for the high temperature (HT) GaN. The NH4Cl layer between a sapphire substrate with GaN dots and the LT GaN buffer were fully evaporated during the HT GaN growth at 1040 °C. Many voids were formed at interface caused by evaporation of the NH4Cl layer, which strongly assisted self-separation of thick HT GaN during cooldown after the growth resulting in a 200 μm thick freestanding (FS) GaN. The FS GaN showed smooth surface morphology and absence of any crack. The a-axis and c-axis lattice constants of FS GaN were 3.189 and 5.185 Å, respectively, which well agrees with those of strain-free bulk GaN. The observed donor-bound exciton emission peak at 3.4718 eV agreed with the peak position of bulk GaN. All these features indicate that the obtained FS GaN through the self-separation process is nearly strain-free.

© 2007 American Institute of Physics

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KEYWORDS and PACS

PACS

  • 81.05.Ea

    III-V semiconductors

  • 81.15.Kk

    Vapor phase epitaxy; growth from vapor phase

  • 81.15.-z

    Methods of deposition of films and coatings; film growth and epitaxy

  • 68.55.A-

    Nucleation and growth

  • 78.55.Cr

    III-V semiconductors

  • 78.66.Fd

    III-V semiconductors

ARTICLE DATA

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

For access to fully linked references, you need to log in.
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