APL Nameplate
  • Volume/Page
  • Keyword
  • DOI
  • Citation
  • Advanced
   
 
 
 

Flickr Twitter UniPHY Group iResearch App Facebook

Applied Physics Letters / Volume 91 / Issue 6 / NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 91, 063111 (2007); http://dx.doi.org/10.1063/1.2767979 (3 pages)

Nondestructive thickness measurement of biological layers at the nanoscale by simultaneous topography and capacitance imaging

Ignacio Casuso1, Laura Fumagalli1, Gabriel Gomila1, and Esteve Padrós2

1Departament d’Electrònica, Universitat de Barcelona and Laboratori de Nanobioenginyeria-IBEC, Parc Científic de Barcelona, Barcelona, Spain 08028
2Unitat de Biofísica, Department de Bioquímica i de Biologia Molecular, Facultat de Medicina i Centre d’Estudis en Biofísica, Universitat Autònoma de Barcelona, Barcelona, Spain 08193

View MapView Map

(Received 30 May 2007; accepted 9 July 2007; published online 7 August 2007)

Nanoscale capacitance images of purple membrane layers are obtained simultaneously to topography in a nondestructive manner by operating alternating current sensing atomic force microscopy in jumping mode. Capacitance images show excellent agreement with theoretical modeling and prove to be a noninvasive method for measuring the thickness of purple membrane layers beyond the single monolayer limit with nanoscale lateral spatial resolution. With the ability of spatially resolving the capacitance while preserving the sample from damaging, this technique can be applied for nanoscale thickness measurement of other biological layers and soft materials in general.

© 2007 American Institute of Physics

RELATED DATABASES

To view database links for this article, you need to log in.

KEYWORDS and PACS

Keywords

atomic force microscopy, biomedical imaging, biomembranes, thickness measurement

PACS

  • 87.64.Dz

    Scanning tunneling and atomic force microscopy

  • 87.16.D-

    Membranes, bilayers, and vesicles

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.2767979

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    J. Graham, M. Kryzeminski, and Z. Popovic, Rev. Sci. Instrum. 71, 2219 (2000)RSINAK000071000005002219000001.

    D. T. Lee, J. P. Pelz, and B. Bhushan, Rev. Sci. Instrum. 73, 3525 (2002)RSINAK000073000010003525000001.

    F. Houzé, P. Chretien, O. Schneegans, R. Meyer, and L. Boyer, Appl. Phys. Lett. 86, 123103 (2005)APPLAB000086000012123103000001.

    P. J. de Pablo, J. Colchero, J. Gomez-Herrero, and A. M. Baro, Appl. Phys. Lett. 73, 3300 (1998)APPLAB000073000022003300000001.

    I. Horcas, R. Fernandez, J. M. Gomez-Rodriguez, J. Colchero, J. Gomez-Herrero, and A. M. Baro, Rev. Sci. Instrum. 78, 013705 (2007)RSINAK000078000001013705000001.

    G. M. Sacha, E. Sahagun, and J. J. Sáenz, J. Appl. Phys. 101, 024310 (2007)JAPIAU000101000002024310000001.


For access to citing articles, you need to log in.


Figures (4)

Access to article objects (figures, tables, multimedia) requires a subscription; log in to view available files.
(Access to supplementary files, where available, is free for this journal.)



Close

Google Calendar

ADVERTISEMENT

Your Recent History Recent History Help

Recently Viewed

  1. Nondestructive thickness measurement of biological layers at the nanoscale by simultaneous topography and capacitance imaging
  2. Raman fingerprint of charged impurities in graphene
  3. Enhanced microwave transmission through a patterned metal film
  4. Field effect in epitaxial graphene on a silicon carbide substrate
  5. Surface plasmon-polariton mediated emission from phosphorescent dendrimer light-emitting diodes
Go to AIP Home
Copyright © American Institute of Physics
close