APL Nameplate
  • Volume/Page
  • Keyword
  • DOI
  • Citation
  • Advanced
   
 
 
 

Flickr Twitter UniPHY Group iResearch App Facebook

Applied Physics Letters / Volume 92 / Issue 19 / MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 92, 192503 (2008); http://dx.doi.org/10.1063/1.2927482 (3 pages)

Temperature dependence of the interface moments in Co2MnSi thin films

N. D. Telling1, P. S. Keatley2, L. R. Shelford2, E. Arenholz3, G. van der Laan1,4, R. J. Hicken2, Y. Sakuraba5, S. Tsunegi6, M. Oogane6, Y. Ando6, K. Takanashi5, and T. Miyazaki7

1Magnetic Spectroscopy Group, STFC Daresbury Laboratory, Warrington WA4 4AD, United Kingdom
2School of Physics, University of Exeter, Stocker Road, Exeter EX4 4QL, United Kingdom
3Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
4Diamond Light Source, Chilton, Didcot OX11 0DE, United Kingdom
5Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
6Department of Applied Physics, Graduate School of Engineering, Tohoku University, Aoba-yama 6-6-05, Sendai 980-8579, Japan
7New Industry Creation Hatchery Center, Tohoku University, Aoba-yama 6-6-10, Sendai 980-8579, Japan

View MapView Map

(Received 2 April 2008; accepted 22 April 2008; published online 13 May 2008)

X-ray magnetic circular dichroism (XMCD) is utilized to explore the temperature dependence of the interface moments in Co2MnSi (CMS) thin films capped with aluminum. By increasing the thickness of the capping layer, we demonstrate enhanced interface sensitivity of the measurements. L21-ordered CMS films show no significant temperature dependence of either the Co or Mn interface moments. However, disordered CMS films show a decreased moment at low temperature possibly caused by increased Mn–Mn antiferromagnetic coupling. It is suggested that for ordered L21 CMS films the temperature dependence of the tunneling magnetoresistance is not related to changes in the interface moments.

© 2008 American Institute of Physics

RELATED DATABASES

To view database links for this article, you need to log in.

KEYWORDS and PACS

Keywords

aluminium, antiferromagnetism, cobalt alloys, interface magnetism, magnetic circular dichroism, magnetic thin films, manganese alloys, silicon alloys, tunnelling magnetoresistance, X-ray absorption spectra

PACS

  • 75.70.Cn

    Magnetic properties of interfaces (multilayers, superlattices, heterostructures)

  • 75.70.Ak

    Magnetic properties of monolayers and thin films

  • 78.20.Ls

    Magneto-optical effects

  • 78.70.Dm

    X-ray absorption spectra

  • 75.47.-m

    Magnetotransport phenomena; materials for magnetotransport

  • 73.50.Jt

    Galvanomagnetic and other magnetotransport effects (including thermomagnetic effects)

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.2927482

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    I. Galanakis, P. H. Dederichs, and N. Papanikolaou, Phys. Rev. B 66, 174429 (2002).

    Y. Sakuraba, M. Hattori, M. Oogane, Y. Ando, H. Kato, A. Sakuma, H. Kubota and T. Miyazaki, Appl. Phys. Lett. 88, 192508 (2006)APPLAB000088000019192508000001.

    X. Kou, J. Schmalhorst, A. Thomas, and G. Reiss, Appl. Phys. Lett. 88, 212115 (2006)APPLAB000088000021212115000001.

    L. Choincel, Y. Sakuraba, E. Arrigoni, M. I. Katsnelson, M. Oogane, Y. Ando, T. Miyazaki, E. Burzo, and A. I. Lichtenstein, Phys. Rev. Lett. 100, 086402 (2008).

    J. Schmalhorst, A. Thomas, S. Kämmerer, O. Schebaum, D. Ebke, M. D. Sacher, G. Reiss, A. Hütten, A. Turchanin, A. Gölzhäuser, and E. Arenholz, Phys. Rev. B 75, 014403 (2007).

    R. Nakajima, J. Stöhr, and Y. U. Idzerda, Phys. Rev. B 59, 6421 (1999).

    N. D. Telling, P. S. Keatley, G. van der Laan, R. J. Hicken, E. Arenholz, Y. Sakuraba, M. Oogane, Y. Ando, and T. Miyazaki, Phys. Rev. B 74, 224439 (2006).

    N. D. Telling, G. van der Laan, S. Ladak, and R. J. Hicken, Appl. Phys. Lett. 85, 3803 (2004)APPLAB000085000017003803000001.

    B. T. Thole and G. van der Laan, Phys. Rev. B 38, 3158 (1988).

    C. T. Chen, Y. U. Idzerda, H.-J. Lin, N. V. Smith, G. Meigs, E. Chaban, G. H. Ho, E. Pellegrin, and F. Sette, Phys. Rev. Lett. 75, 152 (1995)
    B. T. Thole, P. Carra, F. Sette, and G. van der Laan, ibid. 68, 1943 (1992).


For access to citing articles, you need to log in.


Figures (2)

Access to article objects (figures, tables, multimedia) requires a subscription; log in to view available files.
(Access to supplementary files, where available, is free for this journal.)



Close

Google Calendar

ADVERTISEMENT

Your Recent History Recent History Help

Recently Viewed

  1. Temperature dependence of the interface moments in Co2MnSi thin films
  2. Stoichiometric growth of high Curie temperature heavily alloyed GaMnAs
  3. Highly reproducible fabrication of back-gated GaAs/AlGaAs heterostructures using AuGeNi ohmic contacts with initial Ni layer
  4. A scanning near-field middle-infrared microscope for the study of objects submerged in water
  5. Acoustic-counterflow microfluidics by surface acoustic waves
Go to AIP Home
Copyright © American Institute of Physics
close