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Applied Physics Letters / Volume 92 / Issue 2 / LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 92, 021116 (2008); http://dx.doi.org/10.1063/1.2834899 (3 pages)

Shaping tight-focusing patterns of linearly polarized beams through elliptic apertures

Taro Ando, Yoshiyuki Ohtake, Takashi Inoue, Haruyasu Itoh, Naoya Matsumoto, and Norihiro Fukuchi

Hamamatsu Photonics K.K., Central Research Laboratory, Hirakuchi, Hamakita-Ku, Hamamatsu-City, Shizuoka 434-8601, Japan

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(Received 4 October 2007; accepted 23 December 2007; published online 16 January 2008)

We propose elliptic deformation of apertures for shaping focusing patterns of tightly focused linearly polarized beams. Numerical integration of the vectorial Rayleigh-Sommerfeld diffraction formula predicts the formation of symmetric focusing patterns by shrinking the aperture shape in the direction perpendicular to the polarization of the beams. The elliptic deformation is also applied to a focused linearly polarized beam through an annular aperture to demonstrate the formation of smaller symmetric focal spot than that through a simple oval aperture.

© 2008 American Institute of Physics

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KEYWORDS and PACS

Keywords

integration, light polarisation, optical focusing

PACS

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.2834899

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
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    J. W. M. Chon, X. Gan, and M. Gu, Appl. Phys. Lett. 81, 1576 (2002)APPLAB000081000009001576000001.

    R. Dorn, S. Quabis, and G. Leuchs, Phys. Rev. Lett. 91, 233901 (2003).

    M. Martínez-Corral, R. Martínez-Cuenca, I. Escobar, and G. Saavedra, Appl. Phys. Lett. 85, 4319 (2004)APPLAB000085000019004319000001.


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