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21 Jan 2008

Volume 92, Issue 3, Articles (03xxxx)

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Appl. Phys. Lett. 92, 033101 (2008); http://dx.doi.org/10.1063/1.2830979 (3 pages)

Koichiro Zaitsu, Yosuke Kitamura, Keiji Ono, and Seigo Tarucha
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Early detection of nanoparticle growth from x-ray reciprocal space mapping

Nadia A. Zatsepin, Ruben A. Dilanian, Andrei Y. Nikulin, Brian M. Gable, Barry C. Muddle, and Osami Sakata

Appl. Phys. Lett. 92, 034101 (2008); http://dx.doi.org/10.1063/1.2829606 (3 pages) | Cited 3 times

Online Publication Date: 22 January 2008

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The potential for nondestructive in situ detection of the formation of weakly diffracting nanoparticles has been confirmed by a combination of experiment and simulation. A triple axis diffractometer was used to collect two-dimensional reciprocal space maps of diffracted synchrotron x-rays from nanoscale Al2Cu precipitates embedded in a bulk metallic matrix. The appearance and asymmetric profile of the monochromator pseudostreaks are demonstrated to be indicative of the sensitivity of the technique to both the presence and orientation of the nanoparticles. This is a fundamental step toward in situ detection of sparsely dispersed, embedded nanoparticles and to quantitative temporal studies of particle number, scale, and dispersion.
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61.46.Df Structure of nanocrystals and nanoparticles ("colloidal" quantum dots but not gate-isolated embedded quantum dots)
81.70.Cv Nondestructive testing: ultrasonic testing, photoacoustic testing
07.85.-m X- and γ-ray instruments
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