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11 Feb 2008

Volume 92, Issue 6, Articles (06xxxx)

Issue Cover Spotlight Figure

Appl. Phys. Lett. 92, 063101 (2008); http://dx.doi.org/10.1063/1.2839572 (3 pages)

M. N. Ou, T. J. Yang, S. R. Harutyunyan, Y. Y. Chen, C. D. Chen, and S. J. Lai
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Noise suppression by active optics in low-dose electron microscopy

Hiroshi Okamoto

Appl. Phys. Lett. 92, 063901 (2008); http://dx.doi.org/10.1063/1.2870097 (3 pages) | Cited 3 times

Online Publication Date: 14 February 2008

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Show Abstract
Low-dose electron microscopy of radiation sensitive biological specimens achieves only limited resolution because of the inherently weak signal buried in noise. Here, we propose to reduce the noise by using a deformable mirror similar to the Castaing–Henry device to manipulate phase of the electron waves. The method takes advantage of quantum nature of the measurement and nonrandomness of any specimen structure of interest. The simulation revealed 9.7% reduction of noise for the representative case of the ribosome. Increasingly better figures are expected as knowledge about a specimen improves.
Show PACS
87.64.Ee Electron microscopy
41.85.-p Beam optics
87.16.-b Subcellular structure and processes
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