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Applied Physics Letters / Volume 93 / Issue 11 / LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 93, 111104 (2008); http://dx.doi.org/10.1063/1.2977603 (3 pages)

Mapping local defects of extended media using localized structures

F. Pedaci, G. Tissoni, S. Barland, M. Giudici, and J. Tredicce

Institut Non Linéaire de Nice, UMR6618 Université de Nice-CNRS, 1365 Route des Lucioles, 06560 Sophia Antipolis, Valbonne, France

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(Received 12 May 2008; accepted 12 August 2008; published online 15 September 2008)

The stable positions of localized structures depend on spatial gradients in the system parameters and on the local defects of the hosting medium. We propose a general method to disclose and visualize the local defects of the medium structure, otherwise not detected. The method is based on the observation of the spatiotemporal behavior of localized structures in the presence of controlled gradients in the experimental parameters. We experimentally show an application of this method in a broad-area semiconductor vertical cavity surface emitting laser with optical injection. The comparison of the experimental results with numerical simulations shows a very good agreement.

© 2008 American Institute of Physics

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KEYWORDS and PACS

Keywords

laser cavity resonators, localised states, semiconductor lasers, surface emitting lasers

PACS

  • 42.55.Px

    Semiconductor lasers; laser diodes

  • 42.60.By

    Design of specific laser systems

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.2977603

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

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