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Applied Physics Letters / Volume 94 / Issue 25 / STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 94, 251906 (2009); http://dx.doi.org/10.1063/1.3158956 (3 pages)

Method to measure the viscosity of nanometer liquid films from the surface fluctuations

Zhaohui Yang1, Chi-Hang Lam2, Elaine DiMasi3, Nathalie Bouet1, Jean Jordan-Sweet4, and Ophelia K. C. Tsui1

1Department of Physics, Boston University, Boston, Massachusetts 02215, USA
2Department of Applied Physics, Hong Kong Polytechnic University, Hung Hom, Hong Kong
3National Synchrotron Light Source, Brookhaven National Laboratory, Upton, New York 11973, USA
4IBM Research Division, Thomas J. Watson Research Center, Yorktown Heights, New York 10598, USA

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(Received 13 March 2009; accepted 3 June 2009; published online 23 June 2009)

We describe a method to measure the viscosity of polystyrene liquid films with thicknesses ∼ 5 and ∼ 80 nm spin-cast on oxide-coated silicon. In this method, temporal evolution of the film surface is monitored and modeled according to the dynamics of the surface capillary waves. Viscosities obtained from the ∼ 80 nm films display an excellent agreement with those of the bulk polymer, but those from the ∼ 5 nm films are up to 106 times reduced. By modeling the data to the Vogel–Fulcher–Tammann relation, we find that the observations are consistent with the thickness dependence of the glass transition temperature previously reported of these films.

© 2009 American Institute of Physics

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KEYWORDS and PACS

Keywords

capillary waves, glass transition, liquid films, nanotechnology, polymer solutions, viscosity, viscosity measurement

PACS

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3158956

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    H. Kim, A. Ruhm, L. B. Lurio, J. K. Basu, J. Lal, D. Lumma, S. G. J. Mochrie, and S. K. Sinha, Phys. Rev. Lett. 90, 068302 (2003).

    Z. Jiang, H. Kim, X. Jiao, H. Lee, Y. -J. Lee, Y. Byun, S. Song, D. Eom, C. Li, M. H. Rafailovich, L. B. Lurio, and S. K. Sinha, Phys. Rev. Lett. 98, 227801 (2007).

    J. -L. Masson and P. F. Green, Phys. Rev. E 65, 031806 (2002).

    S. K. Sinha, E. B. Sirota, and S. Garoff, Phys. Rev. B 38, 2297 (1988).


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