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Applied Physics Letters / Volume 95 / Issue 10 / LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 95, 101109 (2009); http://dx.doi.org/10.1063/1.3225148 (3 pages)

Combined optical trapping and microphotoluminescence of single InP nanowires

Peter J. Reece1, Suriati Paiman2, Osama Abdul-Nabi1, Qiang Gao2, Michael Gal1, H. Hoe Tan2, and C. Jagadish2

1School of Physics, The University of New South Wales, Sydney, New South Wales 2052, Australia
2Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University, Canberra, Australian Capital Territory 0200, Australia

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(Received 1 July 2009; accepted 16 August 2009; published online 11 September 2009)

In this letter, we demonstrate that microphotoluminescence may be combined with optical trapping for effective optical characterization of single target InP semiconductor nanowires in suspension. Using this technique, we may investigate structural properties of optically trapped nanowires, such as crystalline polytypes and stacking faults. This arrangement may also be used to resolve structural variations along the axis of the trapped nanowire. These results show that photoluminescence measurements may be coupled with optical tweezers without degrading the performance of the optical trap and provide a powerful interrogation tool for preselection of components for nanowire photonic devices.

© 2009 American Institute of Physics

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KEYWORDS and PACS

Keywords

III-V semiconductors, indium compounds, MOCVD, nanowires, photoluminescence, radiation pressure, semiconductor quantum wires, stacking faults, suspensions

PACS

  • 78.67.Lt

    Quantum wires

  • 78.55.Cr

    III-V semiconductors

  • 68.65.La

    Quantum wires (patterned in quantum wells)

  • 81.07.Vb

    Quantum wires

  • 81.15.Gh

    Chemical vapor deposition (including plasma-enhanced CVD, MOCVD, ALD, etc.)

  • 61.72.Nn

    Stacking faults and other planar or extended defects

  • 82.70.Kj

    Emulsions and suspensions

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3225148

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    M. Paladugu, J. Zou, Y. N. Guo, X. Zhang, Y. Kim, H. J. Joyce, Q. Gao, H. H. Tan, and C. Jagadish, Appl. Phys. Lett. 93, 101911 (2008)APPLAB000093000010101911000001.

    J. L. Hernandez-Pozos, W. M. Lee, L. I. Vera-Robles, A. Campero, and K. Dholakia, Appl. Phys. Lett. 93, 243107 (2008)APPLAB000093000024243107000001.

    A. Rohrbach, Phys. Rev. Lett. 95, 168102 (2005).

    H. E. Ruda and A. Shik, Phys. Rev. B 72, 115308 (2005).

    A. Mishra, L. V. Titova, T. B. Hoang, H. E. Jackson, L. M. Smith, J. M. Yarrison-Rice, Y. Kim, H. J. Joyce, Q. Gao, H. H. Tan, and C. Jagadish, Appl. Phys. Lett. 91, 263104 (2007)APPLAB000091000026263104000001.


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