APL Nameplate
  • Volume/Page
  • Keyword
  • DOI
  • Citation
  • Advanced
   
 
 
 

Flickr Twitter UniPHY Group iResearch App Facebook

Applied Physics Letters / Volume 95 / Issue 10 / LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 95, 101110 (2009); http://dx.doi.org/10.1063/1.3222974 (3 pages)

Nanoscale band gap spectroscopy on ZnO and GaN-based compounds with a monochromated electron microscope

M. Bosman1, L. J. Tang1, J. D. Ye1, S. T. Tan1, Y. Zhang1, and V. J. Keast2

1Institute of Microelectronics, A*STAR (Agency for Science, Technology and Research), 11 Science Park Road, Singapore 117685, Singapore
2School of Mathematical and Physical Sciences, The University of Newcastle, Callaghan, New South Wales 2308, Australia

View MapView Map

(Received 1 August 2009; accepted 16 August 2009; published online 11 September 2009)

Monochromated low-loss EELS (electron energy-loss spectroscopy) is explored as an analytical technique for nanoscale mapping of the electronic band gap energy on arsenic-implanted ZnO, CdZnO, and InGaN compounds. Its accuracy is confirmed independently with Raman spectroscopy. From a ternary compound, the relationship between the band gap energy and the chemical composition is determined, a powerful application of low-loss EELS. The effects of electron beam delocalization are discussed using examples from In0.25Ga0.75N quantum wells.

© 2009 American Institute of Physics

RELATED DATABASES

To view database links for this article, you need to log in.

KEYWORDS and PACS

Keywords

arsenic, cadmium compounds, doping profiles, electron energy loss spectra, energy gap, gallium compounds, III-V semiconductors, II-VI semiconductors, indium compounds, ion implantation, nanostructured materials, Raman spectra, scanning electron microscopy, semiconductor doping, semiconductor quantum wells, transmission electron microscopy, wide band gap semiconductors, zinc compounds

PACS

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3222974

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    F. Tuomisto, K. Saarinen, D. C. Look, and G. C. Farlow, Phys. Rev. B 72, 085206 (2005).

    Ü. Özgür, Ya. I. Alivov, C. Liu, A. Teke, M. A. Reshchikov, S. Doğan, V. Avrutin, S. -J. Cho, and H. Morkoçd, J. Appl. Phys. 98, 041301 (2005)JAPIAU000098000004041301000001.

    J. D. Ye, S. Tripathy, F. -F. Ren, X. W. Sun, G. Q. Lo, and K. L. Teo, Appl. Phys. Lett. 94, 011913 (2009)APPLAB000094000001011913000001.

    T. Makino, Y. Segawa, M. Kawasaki, A. Ohtomo, R. Shiroki, K. Tamura, T. Yasuda, and H. Koinuma, Appl. Phys. Lett. 78, 1237 (2001)APPLAB000078000009001237000001.

    Th. Gruber, C. Kirchner, R. Kling, F. Reuss, A. Waag, F. Bertram, D. Forster, J. Christen, and M. Schreck, Appl. Phys. Lett. 83, 3290 (2003)APPLAB000083000016003290000001.

    V. J. Keast, A. J. Scott, M. J. Kappers, C. T. Foxon, and C. J. Humphreys, Phys. Rev. B 66, 125319 (2002).

    A. G. Gutiérrez-Sosa, U. Bangert, A. J. Harvey, C. J. Fall, R. Jones, P. R. Briddon, and M. I. Heggie, Phys. Rev. B 66, 035302 (2002).

    M. Bosman, M. Sitarz, A. Z. Sikorski, and V. J. Keast, Appl. Phys. Lett. 84, 1371 (2004)APPLAB000084000008001371000001.

    P. Perlin, I. Gorczyca, T. Suski, P. Wisniewski, S. Lepkowski, N. E. Christensen, A. Svane, M. Hansen, S. P. DenBaars, B. Damilano, N. Grandjean, and J. Massies, Phys. Rev. B 64, 115319 (2001).

    M. Couillard, M. Kociak, O. Stéphan, G. A. Botton, and C. Colliex, Phys. Rev. B 76, 165131 (2007).


Figures (3)

Access to article objects (figures, tables, multimedia) requires a subscription; log in to view available files.
(Access to supplementary files, where available, is free for this journal.)



Close

Google Calendar

ADVERTISEMENT

Your Recent History Recent History Help

Recently Viewed

  1. Nanoscale band gap spectroscopy on ZnO and GaN-based compounds with a monochromated electron microscope
  2. Combined optical trapping and microphotoluminescence of single InP nanowires
  3. Asymmetric intermediate reflector for tandem micromorph thin film silicon solar cells
  4. Fast discharge speed in poly(vinylidene fluoride) graft copolymer dielectric films achieved by confined ferroelectricity
  5. Dynamic scanning probe microscopy of adsorbed molecules on graphite
Go to AIP Home
Copyright © American Institute of Physics
close