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Applied Physics Letters / Volume 95 / Issue 23 / LASERS, OPTICS, AND OPTOELECTRONICS
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Appl. Phys. Lett. 95, 231106 (2009); http://dx.doi.org/10.1063/1.3266919 (3 pages)

Electron bunch length monitors using spatially encoded electro-optical technique in an orthogonal configuration

X. Yang1, T. Tsang2, T. Rao2, J. B. Murphy1, Y. Shen1, and X. J. Wang1

1National Synchrotron Light Source, Brookhaven National Laboratory, Upton, New York 11973, USA
2Instrumentation Division, Brookhaven National Laboratory, Upton, New York 11973, USA

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(Received 29 July 2009; accepted 2 November 2009; published online 8 December 2009)

A single-shot, nondestructive, electro-optical, electron bunch length monitor is experimentally verified by encoding the Coulomb field of the bunch profile on the spatial intensity distribution of an unchirped femtosecond laser pulse in an orthogonal geometry, hence a temporal-to-spatial transformation. This electron bunch measurement scheme can simultaneously measure large timing jitter (approximately in picoseconds) with a wide measurement time span covering picosecond to subpicosecond ranges.

© 2009 American Institute of Physics

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KEYWORDS and PACS

Keywords

electron accelerators, particle beam bunching

PACS

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3266919

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

  1. See http://www-ssrl.slac.stanford.edu/lcls/ for ultrashort e− bunches.
  2. See http://zms.desy.de/ for intense short e− bunches.
  3. See http://www.rijnh.nl/research/guthz/felix_felice/ for tunable e− bunches.
  4. I. Wilke, A. M. MacLeod, W. A. Gillespie, G. Berden, G. M. H. Knippels, and A. F. G. van der Meer, Phys. Rev. Lett. 88, 124801 (2002). [MEDLINE]
  5. Z. P. Jiang and X. C. Zhang, Quantum Electronics 36, 1214 (2000). [Inspec] [ISI]
  6. J. R. Fletcher, Opt. Express 10, 1425 (2002). [SPIN] [ISI] [MEDLINE]
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  8. B. Steffen, V. Arsov, G. Berden, W. A. Gillespie, S. P. Jamison, A. M. MacLeod, A. F. G. van der Meer, P. J. Phillips, H. Schlarb, B. Schmidt, and P. Schmuser, Phys. Rev. ST Accel. Beams 12, 032802 (2009).
  9. T. Srinivasan-Rao, M. Amin, V. Castillo, D. M. Lazarus, D. Nikas, C. Ozben, Y. K. Semertzidis, A. Stillman, and T. Tsang, Phys. Rev. ST Accel. Beams 5, 042801 (2002). [ISI]
  10. A. L. Cavalieri et al., Phys. Rev. Lett. 94, 114801 (2005). [MEDLINE]
  11. J. B. Murphy and X. J. Wang, Synchrotron Radiation News 21, 41 (2008).
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  13. T. Tsang, V. Castillo, R. Larsen, D. M. Lazarus, D. Nikas, C. Ozben, Y. K. Semertzidis, and T. Srinivasan-Rao, J. Appl. Phys. 89, 4921 (2001)JAPIAU000089000009004921000001.
  14. R. M. Phillips, Nucl. Instrum. Methods A272, 1 (1988).

Figures (click on thumbnails to view enlargements)

FIG.1
(a) Schematic layout of the EO arrangement. (b) The EO module with a YAG crystal for electron beam position monitor.

FIG.1 Download High Resolution Image (.zip file) | Export Figure to PowerPoint

FIG.2
Illustration of electron bunch length broadening caused by the finite thickness of the EO crystal. Each drawing represents a snapshot of the probe laser field interacting with the pancakelike Coulomb field, time starts from left to right.

FIG.2 Download High Resolution Image (.zip file) | Export Figure to PowerPoint

FIG.3
Normalized EO signal when chicane compressor is (a) off, (b) chirp at −22°, and (c) chirp at −32°. Raw EO data (+), modeled electron bunch profile (red solid line), and calculated electron bunch profile after it is convoluted with the thickness of the EO crystal (black solid line). Inset in (b) shows the dependence of the EO signals on the transverse separation between the electron beam and the probe laser position in the ZnTe crystal; the curve is the 1/r fit to a set of EO experimental data.

FIG.3 Download High Resolution Image (.zip file) | Export Figure to PowerPoint

FIG.4
Simulated EO signal pulse width plotted as a function of the electron pulse width for different thickness of ZnTe crystals. A laser pulse width of 120 fs is used in all simulations. Black straight line is the ideal undistorted behavior. Lines are connected for clarity.

FIG.4 Download High Resolution Image (.zip file) | Export Figure to PowerPoint



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