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Applied Physics Letters / Volume 96 / Issue 12 / MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 96, 122501 (2010); http://dx.doi.org/10.1063/1.3360205 (3 pages)

Spatially resolved measurements of the ferromagnetic phase transition by ac-susceptibility investigations with x-ray photoelectron emission microscope

F. M. Römer1, F. Kronast2, L. Heyne3, C. Hassel1, A. Banholzer1, M. Kläui3, R. Meckenstock1, J. Lindner1, and M. Farle1

1Department of Physics and Center for Nanointegration (CeNIDE), University of Duisburg–Essen, Lotharstr. 1, 47048 Duisburg, Germany
2Helmholtz-Zentrum Berlin, Bessy II, Albert-Einstein-Str. 15, 12489 Berlin, Germany
3Department of Physics, University of Konstanz, Universitätsstr. 10, 78457 Konstanz, Germany

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(Received 13 January 2010; accepted 21 February 2010; published online 22 March 2010)

Spatially resolved ac susceptibility measurements on epitaxial Fe films are performed as a function of temperature using a conventional soft-x-ray photoelectron emission microscope. A magnetic contrast is observed at sample locations where the magnetic film undergoes a para/ferromagnetic phase transition. Due to the wedge structure of the Fe film and the thickness dependence of the Curie temperature the spatial extend of the phase transition region and the correlation length can be estimated.

© 2010 American Institute of Physics

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KEYWORDS and PACS

Keywords

Curie temperature, ferromagnetic materials, ferromagnetic-paramagnetic transitions, iron, magnetic epitaxial layers, magnetic susceptibility, paramagnetic materials, X-ray photoelectron spectra

PACS

  • 75.70.Ak

    Magnetic properties of monolayers and thin films

  • 75.30.Kz

    Magnetic phase boundaries (including classical and quantum magnetic transitions, metamagnetism, etc.)

  • 75.30.Cr

    Saturation moments and magnetic susceptibilities

  • 75.20.En

    Metals and alloys

  • 79.60.Bm

    Clean metal, semiconductor, and insulator surfaces

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3360205

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

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