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Applied Physics Letters / Volume 96 / Issue 18 / LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 96, 181109 (2010); http://dx.doi.org/10.1063/1.3425896 (3 pages)

Peculiar features of confinement factors in a metal-semiconductor waveguide

D. B. Li and C. Z. Ning

School of Electrical, Computer and Energy Engineering, Center of Nanophotonics, Arizona State University, Tempe, Arizona 85287, USA

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(Received 24 December 2009; accepted 15 April 2010; published online 6 May 2010)

The concept of confinement factor (CF) is analyzed for a metal-semiconductor-metal (MSM) waveguide near the surface plasmon resonance. We show that the CF is inversely proportional to the average energy velocity, and thus can be enhanced by the slowing down of energy propagation. This slowing down in the MSM waveguide results in a value of CF as high as 105, as opposed to a value of smaller than 1 in a typically dielectric structure. Contrary to the CF in pure dielectric waveguide where it is independent of material gain, the CF in MSM waveguide shows a resonancelike dependence on material gain near the surface plasmon resonance.

© 2010 American Institute of Physics

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KEYWORDS and PACS

Keywords

metal-semiconductor-metal structures, optical waveguides, surface plasmon resonance

PACS

  • 42.79.Gn

    Optical waveguides and couplers

  • 73.20.Mf

    Collective excitations (including excitons, polarons, plasmons and other charge-density excitations)

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3425896

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    D. B. Li and C. Z. Ning, Phys. Rev. B 80, 153304 (2009).

    Y. Z. Huang, Z. Pan, and R. Wu, J. Appl. Phys. 79, 3827 (1996)JAPIAU000079000008003827000001.


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