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Applied Physics Letters / Volume 96 / Issue 18 / STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 96, 181902 (2010); http://dx.doi.org/10.1063/1.3420080 (3 pages)

Ellipsometric study of single-crystal γ-InSe from 1.5 to 9.2 eV

S. G. Choi1, D. E. Aspnes2, A. L. Fuchser3, C. Martinez-Tomas4, V. Muñoz Sanjosé4, and D. H. Levi1

1National Renewable Energy Laboratory, Golden, Colorado 80401, USA
2Department of Physics, North Carolina State University, Raleigh, North Carolina 27695, USA
3J.A. Woollam Co. Inc., Lincoln, Nebraska 68508, USA
4Departamento de Física Aplicada i Electromagnetismo, Universitat de València, C/Dr. Moliner 50, 46100 Burjassot, Spain

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(Received 4 January 2010; accepted 9 April 2010; published online 6 May 2010)

We report the component math⊥math of the pseudodielectric-function tensor 〈ε(E)〉 = 〈ε1(E)〉+i〈ε2(E)〉 of γ-phase single-crystal InSe, obtained from 1.5 to 9.2 eV by vacuum-ultraviolet spectroscopic ellipsometry with the sample at room temperature. Overlayer artifacts were reduced as far as possible by measuring fresh surfaces prepared by cleavage. Accurate critical-point energies of observed structures were obtained by a combined method of spectral analysis.

© 2010 American Institute of Physics

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KEYWORDS and PACS

Keywords

critical points, dielectric function, ellipsometry, III-VI semiconductors, indium compounds, Kramers-Kronig relations, optical films, ultraviolet spectra

PACS

  • 81.05.Hd

    Other semiconductors

  • 78.66.Li

    Other semiconductors

  • 78.20.Ci

    Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)

  • 77.22.Ch

    Permittivity (dielectric function)

  • 71.45.Gm

    Exchange, correlation, dielectric and magnetic response functions, plasmons

  • 78.40.Fy

    Semiconductors

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3420080

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

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