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Applied Physics Letters / Volume 96 / Issue 18 / NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 96, 183109 (2010); http://dx.doi.org/10.1063/1.3427420 (3 pages)

Wettability study using transmitted electrons in environmental scanning electron microscope

Z. Barkay

Wolfson Applied Materials Research Center, Tel-Aviv University, Tel-Aviv 69978, Israel

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(Received 16 March 2010; accepted 16 April 2010; published online 6 May 2010)

A method for quantitative wettability study at nanoscale is presented. It is based on measuring transmitted electrons through nanodroplets using wet scanning transmission electron microscope (wet-STEM) detector in environmental scanning electron microscope. The quantitative information of the nanodroplet shape and contact angle is obtained by fitting Monte Carlo simulation results for transmitted electrons through spherical cap geometry with the experimental wet-STEM results. The characterization is demonstrated for particles and for initial stages of water droplet condensation over a nonhomogeneous holey carbon grid. The method is suggested for application in thin polymer and biological films.

© 2010 American Institute of Physics

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KEYWORDS and PACS

Keywords

contact angle, drops, Monte Carlo methods, scanning electron microscopy, water, wetting

PACS

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3427420

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    K. K. Varanasi, M. Hsu, N. Bhate, W. Yang, and T. Deng, Appl. Phys. Lett. 95, 094101 (2009)APPLAB000095000009094101000001.

    D. Aronov, G. Rosenman, and Z. Barkay, J. Appl. Phys. 101, 084901 (2007)JAPIAU000101000008084901000001.


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