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Applied Physics Letters / Volume 96 / Issue 2 / LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 96, 021103 (2010); doi:10.1063/1.3276081 (3 pages)

Development of a nonlinear nanoprobe for interferometric autocorrelation based characterization of ultrashort optical pulses

Haifeng Li1, Yaoshun Jia2, Qian Xu1, Kebin Shi1, Jian Wu3, Peter C. Eklund3,4, Yong Xu2, and Zhiwen Liu1

1Department of Electrical Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802, USA
2Department of Electrical and Computer Engineering, Virginia Tech, Blacksburg, Virginia 24061, USA
3Departments of Physics, The Pennsylvania State University, University Park, Pennsylvania 16802, USA
4Department of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802, USA

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(Received 7 August 2009; accepted 7 November 2009; published online 11 January 2010)

Near-field scanning can achieve nanoscale resolution while ultrashort pulse diagnostic tools can characterize femtosecond pulses. Yet currently it is still challenging to nonperturbatively characterize the near field of an ultrashort optical pulse with nanofemtoscale spatiotemporal resolution. To address this challenge, we propose to develop a nonlinear nanoprobe composed of a silica fiber taper, a nanowire, and nonlinear fluorescent spheres. Using such a nanoprobe, we also report proof-of-principle characterization of femtosecond optical pulse through interferometric autocorrelation measurement.

© 2010 American Institute of Physics

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KEYWORDS and PACS

Keywords

high-speed optical techniques, light interferometers, microelectrodes, nanostructured materials, nanotechnology, nonlinear optics, scanning probe microscopy, silicon compounds

PACS

  • 07.79.-v

    Scanning probe microscopes and components

  • 42.65.Re

    Ultrafast processes; optical pulse generation and pulse compression

  • 07.60.Ly

    Interferometers

  • 42.70.Nq

    Other nonlinear optical materials; photorefractive and semiconductor materials

  • 81.07.Gf

    Nanowires

  • 81.07.Oj

    Nanoelectromechanical systems (NEMS)

ARTICLE DATA

Permalink
http://link.aip.org/link/doi/10.1063/1.3276081

PUBLICATION DATA

ISSN:

0003-6951 (print)  
1077-3118 (online)

Publisher:

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    R. S. Wagner and W. C. Ellis, Appl. Phys. Lett. 4, 89 (1964)APPLAB000004000005000089000001.


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