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24 May 2010

Volume 96, Issue 21, Articles (21xxxx)

Issue Cover Spotlight Figure

Appl. Phys. Lett. 96, 213701 (2010); http://dx.doi.org/10.1063/1.3431628 (3 pages)

Satish Rao, Saurabh Raj, Stefan Balint, Carlota Bardina Fons, Susana Campoy, Montserrat Llagostera, and Dmitri Petrov
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Comment on “Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy” [ Appl. Phys. Lett. 75, 2435 (1999) ]

Mohammed Shahriar Sabuktagin

Appl. Phys. Lett. 96, 216101 (2010); http://dx.doi.org/10.1063/1.3431743 (1 page) | Cited 1 time

Online Publication Date: 24 May 2010

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Abstract Unavailable
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73.40.Lq Other semiconductor-to-semiconductor contacts, p-n junctions, and heterojunctions
72.20.Jv Charge carriers: generation, recombination, lifetime, and trapping
73.25.+i Surface conductivity and carrier phenomena
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Response to “Comment on ‘Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy’ ” [ Appl. Phys. Lett. 96, 216101 (2010) ]

R. Shikler and Y. Rosenwaks

Appl. Phys. Lett. 96, 216102 (2010); http://dx.doi.org/10.1063/1.3431744 (1 page)

Online Publication Date: 24 May 2010

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Abstract Unavailable
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72.20.Jv Charge carriers: generation, recombination, lifetime, and trapping
66.30.-h Diffusion in solids
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