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Applied Physics Letters / Volume 96 / Issue 22 / STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

Appl. Phys. Lett. 96, 221904 (2010); http://dx.doi.org/10.1063/1.3435486 (3 pages)

Microstructure of epitaxial strained BiCrO3 thin films

A. David, Ph. Boullay, R. V. K. Mangalam, N. Barrier, and W. Prellier

Laboratoire CRISMAT, CNRS UMR 6508, ENSICAEN, 6 Bd Maréchal Juin, F-14050 Caen Cedex 4, France

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(Received 29 March 2010; accepted 4 May 2010; published online 2 June 2010)

The structure and microstructure of fully strained BiCrO3 thin films have been investigated by x-rays diffraction and transmission electron diffraction, at room temperature. Interestingly, three structural variants are simultaneously stabilized within the film. While two of them are consistent with the existing phases in the bulk-below and above the 420 K structural transition, a different phase is identified. The existence of various structures has been attributed to the inhomogeneous distribution of local strains and oxygens resulting from a minimization of the strain-energy at the interface. These findings will open the route to a better understanding of Bi-based perovskites and metastable phases.

© 2010 American Institute of Physics

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KEYWORDS and PACS

Keywords

bismuth compounds, epitaxial layers, ferroelectric thin films, internal stresses, multiferroics, phase separation, pulsed laser deposition, X-ray diffraction

PACS

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3435486

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
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