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Applied Physics Letters / Volume 96 / Issue 22 / DIELECTRICS AND FERROELECTRICITY

Appl. Phys. Lett. 96, 222906 (2010); http://dx.doi.org/10.1063/1.3446838 (3 pages)

Electromechanical probing of ionic currents in energy storage materials

A. N. Morozovska1, E. A. Eliseev2, and S. V. Kalinin3

1Institute of Semiconductor Physics, National Academy of Science of Ukraine, 41, pr. Nauki, 03028 Kiev, Ukraine
2Institute for Problems of Materials Science, National Academy of Science of Ukraine, 3, Krjijanovskogo, 03142 Kiev, Ukraine
3The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37922, USA

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(Received 4 February 2010; accepted 16 May 2010; published online 4 June 2010)

The electrochemical processes in energy storage materials are generally linked with changes of molar volume of the host compound. Here, the frequency dependent strain response of one-dimensional electrochemically active system to periodic electric bias is analyzed. The sensitivity and resolution of electrochemical strain measurements are compared to the current-based electrochemical impedance spectroscopy. The resolution and detection limits of interferometric and atomic force microscopy based systems for probing electrochemical reactions on the nanoscale are analyzed.

© 2010 American Institute of Physics

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KEYWORDS and PACS

Keywords

atomic force microscopy, density, electrochemical impedance spectroscopy, electron probes, energy storage

PACS

  • 07.78.+s

    Electron, positron, and ion microscopes; electron diffractometers

  • 82.80.Kq

    Energy-conversion spectro-analytical methods (e.g., photoacoustic, photothermal, and optogalvanic spectroscopic methods)

  • 81.16.Ta

    Atom manipulation

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3446838

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    R. Shao, S. V. Kalinin, and D. A. Bonnell, Appl. Phys. Lett. 82, 1869 (2003)APPLAB000082000012001869000001.

    R. O'Hayre, G. Feng, W. D. Nix, and F. B. Prinz, J. Appl. Phys. 96, 3540 (2004)JAPIAU000096000006003540000001.

    F. X. Hart and J. B. Bates, J. Appl. Phys. 83, 7560 (1998)JAPIAU000083000012007560000001.

    R. Herdier, D. Jenkins, E. Dogheche, D. Rèmiens, and M. Sulc, Rev. Sci. Instrum. 77, 093905 (2006)RSINAK000077000009093905000001
    and references therein.


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