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Applied Physics Letters / Volume 96 / Issue 22 / NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 96, 223106 (2010); http://dx.doi.org/10.1063/1.3443731 (3 pages)

A three-dimensional model of electrical percolation thresholds in carbon nanotube-based composites

Weibang Lu, Tsu-Wei Chou, and Erik T. Thostenson

Department of Mechanical Engineering and Center for Composite Materials, University of Delaware, Newark, Delaware 19716, USA

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(Received 15 March 2010; accepted 11 May 2010; published online 2 June 2010)

A three-dimensional modeling approach is developed to simulate the electrical percolation thresholds in carbon nanotube-based composites, wherein the effects of intertube Van der Waals interactions and electrical tunneling are taken into consideration. Numerical studies using the Monte Carlo method show that these two factors play significant roles when the aspect ratio of the constituent carbon nanotubes is low. For high aspect ratios, the effects of these two factors are negligible. The influence of carbon nanotube waviness on electrical percolation thresholds has also been studied.

© 2010 American Institute of Physics

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KEYWORDS and PACS

Keywords

carbon nanotubes, composite materials, Monte Carlo methods, percolation, tunnelling

PACS

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3443731

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    J. T. Wescott, P. Kung, and A. Maiti, Appl. Phys. Lett. 90, 033116 (2007)APPLAB000090000003033116000001.

    C. Y. Li and T. W. Chou, Appl. Phys. Lett. 90, 174108 (2007)APPLAB000090000017174108000001.

    L. Berhan and A. M. Sastry, Phys. Rev. E 75, 041120 (2007).

    B. Gao, D. C. Glattli, B. Placais, and A. Bachtold, Phys. Rev. B 74, 085410 (2006).

    M. Salvato, M. Cirillo, M. Lucci, S. Orlanducci, I. Ottaviani, M. L. Terranova, and F. Toschi, Phys. Rev. Lett. 101, 246804 (2008).

    C. Y. Li, E. T. Thostenson, and T. W. Chou, Appl. Phys. Lett. 91, 223114 (2007)APPLAB000091000022223114000001.


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