Roles of interfacial TiOxN1−x layer and TiN electrode on bipolar resistive switching in TiN/TiO2/TiN frameworks

Kwak, June Sik; Do, Young Ho; Bae, Yoon Cheol; Im, Hyun Sik; Yoo, Jong Hee; Sung, Min Gyu; Hwang, Yun Taek; Hong, Jin Pyo

doi:doi:10.1063/1.3442499

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Current transport and barrier height evaluation in Ni/InAlN/GaN Schottky diodes

The current-voltage characteristics of the Ni/InAlN/GaN Schottky diodes were measured at various temperatures in the range of 300–700 K. The experimental data were analyzed considering different current-transport mechanisms. From the analysis it follows that the tunneling current, which might be due to a multistep tunneling along dislocations, is the dominant component at all temperatures in the samples investigated. The barrier height of the Ni/InAlN/GaN Schottky diodes, evaluated from the the...

Ion transport and storage of ionic liquids in ionic polymer conductor network composites

We investigate ion transport and storage of ionic liquids in ionic polymer conductor network composite electroactive devices. Specifically, we show that by combining the time domain electric and electromechanical responses, one can gain quantitative information on transport behavior of the two mobile ions in ionic liquids (i.e., cation and anion) in these electroactive devices. By employing a two carrier model, the total excess ions stored and strains generated by the cations and anions, and th...

Reversible counter-clockwise and clockwise resistive switching in a TiN/TiO₂/TiN structure was studied by different polarities of bias voltage. The nature of the bipolar switching phenomenon is related to the creation and annihilation of filament paths caused by redox reactions at locally confined interfaces between the TiO₂ layer and TiN electrode. The analysis of electron energy loss spectroscopy (EELS) confirmed the formation of interfacial TiO_xN_1−x layer between the TiO₂ and TiN bottom electrode. The TiO_xN_1−x layer reduces current levels of ON and OFF states by partially blocking oxygen ion drift to the TiN bottom electrode.

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KEYWORDS and PACS

Keywords

diffusion barriers, electrochemical electrodes, electroforming, electron energy loss spectra, oxidation, reduction (chemical), surface chemistry, switching, titanium compounds

PACS

68.35.Fx

Diffusion; interface formation
82.45.Fk

Electrodes
79.20.Uv

Electron energy loss spectroscopy
82.65.+r

Surface and interface chemistry; heterogeneous catalysis at surfaces

ARTICLE DATA

Digital Object Identifier

http://dx.doi.org/10.1063/1.3442499

PUBLICATION DATA

ISSN

0003-6951 (print)

1077-3118 (online)

Publisher

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American Institute of Physics

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