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Applied Physics Letters / Volume 96 / Issue 26 / MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 96, 262505 (2010); http://dx.doi.org/10.1063/1.3449123 (3 pages)

Influence of edges on the exchange bias properties of ferromagnetic/antiferromagnetic nanodots

V. Baltz, G. Gaudin, P. Somani, and B. Dieny

SPINTEC, UMR(8191) CEA/CNRS/UJF/Grenoble INP, INAC, 17 rue des Martyrs, 38054 Grenoble Cedex, France

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(Received 23 March 2010; accepted 18 May 2010; published online 28 June 2010)

For ferromagnetic (F)/antiferromagnetic (AF) nanodots contributions of AF spins to exchange bias is discussed. The relative weights of AF entities located at the dot edges, at the F/AF interface and in the AF grains were obtained by comparing the blocking temperature distribution of an array of nanodots with that of corresponding continuous film. Due to grain cutting, the grain size distribution is altered. We show here that the dot edges constitute additional locations for the formation of spin-glasslike AF regions at the F/AF interface. The result of patterning is thus twofold and weakens the dot ability to resist thermally activated magnetization reversal.

© 2010 American Institute of Physics

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KEYWORDS and PACS

Keywords

antiferromagnetic materials, ferromagnetic materials, grain size, interface states, magnetisation reversal, nanostructured materials

PACS

  • 75.60.Jk

    Magnetization reversal mechanisms

  • 73.20.At

    Surface states, band structure, electron density of states

  • 75.50.Ee

    Antiferromagnetics

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3449123

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
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