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Applied Physics Letters / Volume 96 / Issue 26 / MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 96, 262509 (2010); http://dx.doi.org/10.1063/1.3459148 (3 pages)

Effect of structural relaxation and oxidation conditions on interlayer exchange coupling in Fe|MgO|Fe tunnel junctions

H. X. Yang1, M. Chshiev1,2, A. Kalitsov1, A. Schuhl1, and W. H. Butler2

1SPINTEC, UMR-8191, CEA-INAC/CNRS/UJF—Grenoble 1/Grenoble-INP, Grenoble 38054, France
2MINT Center, University of Alabama, Tuscaloosa, Alabama 35487-0209, USA

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(Received 23 February 2010; accepted 10 June 2010; published online 1 July 2010)

The effect of structural relaxation and interfacial oxidation is demonstrated from first principles to have a crucial impact on interlayer exchange coupling (IEC) in crystalline Fe|MgO|Fe magnetic tunnel junctions (MTJs). It is shown that the IEC becomes antiferromagnetic for the relaxed structure in contrast to ferromagnetic for unrelaxed Fe|MgO|Fe MTJs. Furthermore, the antiferromagnetic IEC is strongly enhanced in the presence of oxygen vacancies while it is decreased by overoxidation and may even become ferromagnetic for sufficiently high oxygen concentration at the Fe∣MgO interface. These results were supported using a tight-binding model and provide an explanation for recent experimental studies.

© 2010 American Institute of Physics

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KEYWORDS and PACS

Keywords

ab initio calculations, antiferromagnetic materials, ferromagnetic materials, interface magnetism, iron, magnesium compounds, magnetic tunnelling, oxidation, tight-binding calculations

PACS

  • 75.70.Cn

    Magnetic properties of interfaces (multilayers, superlattices, heterostructures)

  • 75.50.Ee

    Antiferromagnetics

  • 81.65.Mq

    Oxidation

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3459148

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

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