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Applied Physics Letters / Volume 96 / Issue 4 / MAGNETISM AND SUPERCONDUCTIVITY

Appl. Phys. Lett. 96, 042501 (2010); http://dx.doi.org/10.1063/1.3291942 (3 pages)

Soft x-ray holographic microscopy

Daniel Stickler1, Robert Frömter1, Holger Stillrich1, Christian Menk1, Carsten Tieg2, Simone Streit-Nierobisch3, Michael Sprung3, Christian Gutt3, Lorenz-M. Stadler3, Olaf Leupold3, Gerhard Grübel3, and Hans Peter Oepen1

1Institut für Angewandte Physik, Universität Hamburg, Jungiusstr. 11, 20355 Hamburg, Germany
2European Synchrotron Radiation Facility (ESRF), B.P. 200, F-38043 Grenoble Cedex, France
3Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, 22607 Hamburg, Germany

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(Received 21 September 2009; accepted 9 December 2009; published online 25 January 2010)

We present a new x-ray microscopy technique based on Fourier transform holography (FTH), where the sample is separate from the optics part of the setup. The sample can be shifted with respect to the holography optics, thus large-scale or randomly distributed objects become accessible. As this extends FTH into a true microscopy technique, we call it x-ray holographic microscopy (XHM). FTH allows nanoscale imaging without the need for nanometer-size beams. Simple Fourier transform yields an unambiguous image reconstruction. We demonstrate XHM by studying the magnetic domain evolution of a Co/Pt multilayer film as function of locally varied iron overlayer thickness.

© 2010 American Institute of Physics

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KEYWORDS and PACS

Keywords

cobalt, Fourier transform optics, holography, image reconstruction, magnetic domains, magnetic multilayers, magnetic thin films, nanophotonics, optical microscopy, platinum, X-ray microscopy, X-ray optics

PACS

  • 07.85.Tt

    X-ray microscopes

  • 42.40.My

    Applications

  • 75.70.Cn

    Magnetic properties of interfaces (multilayers, superlattices, heterostructures)

  • 75.60.Ch

    Domain walls and domain structure

  • 75.70.Kw

    Domain structure (including magnetic bubbles and vortices)

  • 42.30.Wb

    Image reconstruction; tomography

  • 42.30.Kq

    Fourier optics

  • 07.60.Pb

    Conventional optical microscopes

  • 07.85.-m

    X- and γ-ray instruments

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3291942

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    L. -M. Stadler, C. Gutt, T. Autenrieth, O. Leupold, S. Rehbein, Y. Chushkin, and G. Grübel, Phys. Rev. Lett. 100, 245503 (2008).

    C. M. Günther, F. Radu, A. Menzel, S. Eisebitt, W. F. Schlotter, R. Rick, J. Lüning, and O. Hellwig, Appl. Phys. Lett. 93, 072505 (2008)APPLAB000093000007072505000001
    A. Scherz, W. F. Schlotter, K. Chen, R. Rick, J. Stöhr, J. Lüning, I. McNulty, C. Günther, F. Radu, W. Eberhardt, O. Hellwig, and S. Eisebitt, Phys. Rev. B 76, 214410 (2007), T. Hauet, C. M. Günther, B. Pfau, M. E. Schabes, J. -U. Thiele, R. L. Rick, P. Fischer, S. Eisebitt, and O. Hellwig, ibid. 77, 184421 (2008).

    A. Scherz, D. Zhu, R. Rick, W. F. Schlotter, S. Roy, J. Lüning, and J. Stöhr, Phys. Rev. Lett. 101, 076101 (2008).

    W. F. Schlotter, R. Rick, K. Chen, A. Scherz, J. Stöhr, J. Lüning, S. Eisebitt, C. Günther, W. Eberhardt, O. Hellwig, and I. McNulty, Appl. Phys. Lett. 89, 163112 (2006)APPLAB000089000016163112000001.

    H. Stillrich, C. Menk, R. Frömter, and H. P. Oepen, J. Appl. Phys. 105, 07C308 (2009)JAPIAU00010500000707C308000001.

    R. Nakajima, J. Stöhr, and Y. U. Idzerda, Phys. Rev. B 59, 6421 (1999).

    S. Streit-Nierobisch, D. Stickler, C. Gutt, L. -M. Stadler, H. Stillrich, C. Menk, R. Frömter, C. Tieg, O. Leupold, H. P. Oepen, and G. Grübel, J. Appl. Phys. 106, 083909 (2009)JAPIAU000106000008083909000001.


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