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Applied Physics Letters / Volume 96 / Issue 8 / INTERDISCIPLINARY AND GENERAL PHYSICS

Appl. Phys. Lett. 96, 084103 (2010); http://dx.doi.org/10.1063/1.3310281 (3 pages)

High-brightness water-window electron-impact liquid-jet microfocus source

P. Skoglund, U. Lundström, U. Vogt, and H. M. Hertz

Department of Applied Physics, Biomedical and X-Ray Physics, Royal Institute of Technology, SE-10691 Stockholm, Sweden

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(Received 11 November 2009; accepted 19 January 2010; published online 24 February 2010)

We demonstrate stable high-brightness operation of an electron-impact water-jet-anode soft x-ray source. A 30 kV, 7.8 W electron beam is focused onto a 20 μm diameter jet resulting in water-window oxygen line emission at 525 eV/2.36 nm with a brightness of 3.0×109 ph/(s×μm2×sr×line). Monte Carlo-based modeling shows good quantitative agreement with the experiments. The source has potential to increase the x-ray power and brightness by another 1–2 orders of magnitude and fluid-dynamical jet instabilities is determined to be the most important limiting factor. The source properties make it an attractive alternative for table-top x-ray microscopy.

© 2010 American Institute of Physics

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KEYWORDS and PACS

Keywords

electron beam effects, flow instability, jets, Monte Carlo methods, X-ray microscopy, X-ray production

PACS

  • 07.85.Fv

    X- and γ-ray sources, mirrors, gratings, and detectors

  • 47.20.-k

    Flow instabilities

  • 02.70.Uu

    Applications of Monte Carlo methods

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3310281

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    P. A. C. Jansson, U. Vogt, and H. M. Hertz, Rev. Sci. Instrum. 76, 043503 (2005)RSINAK000076000004043503000001.

    O. Hemberg, M. Otendal, and H. M. Hertz, Appl. Phys. Lett. 83, 1483 (2003)APPLAB000083000007001483000001.

    M. Otendal, T. Tuohimaa, U. Vogt, and H. M. Hertz, Rev. Sci. Instrum. 79, 016102 (2008)RSINAK000079000001016102000001.

    T. Tuohimaa, J. Ewald, M. Schlie, H. M. Hertz, and U. Vogt, Appl. Phys. Lett. 92, 233509 (2008)APPLAB000092000023233509000001.

    T. Wilhein, S. Rehbein, D. Hambach, M. Berglund, L. Rymell, and H. M. Hertz, Rev. Sci. Instrum. 70, 1694 (1999)RSINAK000070000003001694000001.

    J. H. Guo, Y. Luo, A. Augustsson, J. E. Rubensson, C. Såthe, H. A. Ågren, H. Siegbahn, and J. Nordgren, Phys. Rev. Lett. 89, 137402 (2002).


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