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Applied Physics Letters / Volume 96 / Issue 9 / PLASMAS AND ELECTRICAL DISCHARGES

Appl. Phys. Lett. 96, 091501 (2010); http://dx.doi.org/10.1063/1.3327800 (3 pages)

The influence of impurities on the performance of the dielectric barrier discharge

T. Martens1, A. Bogaerts1, W. J. M. Brok2, and J. van Dijk2

1Department of Chemistry, University of Antwerp, Universiteitsplein 1, B-2610 Antwerp, Belgium
2Department of Applied Physics, Eindhoven University of Technology, 5600 MB Eindhoven, The Netherlands

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(Received 11 December 2009; accepted 29 January 2010; published online 4 March 2010)

In this letter, we investigate the effect of various levels of nitrogen impurity on the electrical performance of an atmospheric pressure dielectric barrier discharge in helium. We illustrate the different current profiles that are obtained, which exhibit one or more discharge pulses per half cycle and evaluate their performance in ionizing the discharge and dissipating the power. It is shown that flat and broad current profiles perform the best in ionizing the discharge and use the least amount of power per generated charged particle.

© 2010 American Institute of Physics

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KEYWORDS and PACS

Keywords

helium, impurities, nitrogen, partial discharges

PACS

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3327800

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    L. Mangolini, K. Orlov, U. Kortshagen, J. Heberlein, and U. Kogelschatz, Appl. Phys. Lett. 80, 1722 (2002)APPLAB000080000010001722000001.

    J. Shin and L. Raja, J. Appl. Phys. 94, 7408 (2003)JAPIAU000094000012007408000001.

    T. Martens, A. Bogaerts, W. J. M. Brok, and J. v Dijk, Appl. Phys. Lett. 92, 041504 (2008)APPLAB000092000004041504000001.


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