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Appl. Phys. Lett. 96, 092901 (2010); http://dx.doi.org/10.1063/1.3330963 (3 pages)

Observation of domain structure in 001 orientated NaNbO3 films deposited on (001)SrTiO3 substrates by laser beam scanning microscopy

Seiji Yamazoe, Hiroyuki Sakurai, Takehisa Saito, and Takahiro Wada

Department of Materials Chemistry, Ryukoku University, Seta, Otsu 520-2194, Japan

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(Received 15 December 2009; accepted 30 January 2010; published online 1 March 2010)

A laser beam scanning microscope (LSM) was used to observe the domain structure of 001 orientated NaNbO3 (NN) films on SrRuO3/(001)SrTiO3 substrates. The LSM micrograph clearly showed the domains and the domain walls of NN film. Using a polarization plate revealed that the deposited NN film had antiferroelectric 90° domains separated by {100} domain walls. When 001 orientated NN film was applied by an electric field, the 90° domains and the {100} domain walls disappeared and a new domain structure and {110} domain walls were created. This drastic change is due to the formation of new 60° domains.

© 2010 American Institute of Physics

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KEYWORDS and PACS

PACS

  • 68.55.-a

    Thin film structure and morphology

  • 81.15.Fg

    Pulsed laser ablation deposition

ARTICLE DATA

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

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