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Applied Physics Letters / Volume 96 / Issue 9 / NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 96, 093102 (2010); http://dx.doi.org/10.1063/1.3327812 (3 pages)

A compact, transportable, microchip-based system for high repetition rate production of Bose–Einstein condensates

Daniel M. Farkas, Kai M. Hudek, Evan A. Salim, Stephen R. Segal, Matthew B. Squires, and Dana Z. Anderson

JILA, University of Colorado and National Institute of Standards and Technology, Boulder, Colorado 80309, USA

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(Received 3 December 2009; accepted 30 January 2010; published online 1 March 2010)

We present a compact, transportable system that produces Bose–Einstein condensates near the surface of an integrated atom microchip. The system occupies a volume of 0.4 m3, operates at a repetition rate as high as 0.3 Hz, and consumes an average power of 525 W. Evaporative cooling in a chip trap with trap frequencies of several kilohertz leads to nearly pure condensates containing 1.9×104 mathb atoms. Partial condensates are observed at a temperature of 1.58(8) μK, close to the theoretical transition temperature of 1.1 μK.

© 2010 American Institute of Physics

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KEYWORDS and PACS

Keywords

Bose-Einstein condensation, cooling, magneto-optical devices, permanent magnets, semiconductor lasers

PACS

  • 85.70.Sq

    Magnetooptical devices

  • 75.50.Ww

    Permanent magnets

  • 42.60.By

    Design of specific laser systems

  • 42.55.Px

    Semiconductor lasers; laser diodes

  • 42.50.Wk

    Mechanical effects of light on material media, microstructures and particles

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3327812

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    M. H. Anderson, J. R. Ensher, M. R. Matthews, C. E. Wieman, and E. A. Cornell, Science 269, 198 (1995)APPLAB000088000026264103000001.

    K. B. Davis, M. O. Mewes, M. R. Andrews, N. J. van Druten, D. S. Durfee, D. M. Kurn, and W. Ketterle, Phys. Rev. Lett. 75, 3969 (1995).

    C. C. Bradley, C. A. Sackett, and R. G. Hulet, Phys. Rev. Lett. 78, 985 (1997).

    P. Treutlein, P. Hommelhoff, T. Steinmetz, T. W. Hänsch, and J. Reichel, Phys. Rev. Lett. 92, 203005 (2004).

    J. M. McGuirk, G. T. Foster, J. B. Fixler, M. J. Snadden, and M. A. Kasevich, Phys. Rev. A 65, 033608 (2002).

    S. Wildermuth, S. Hofferberth, I. Lesanovsky, S. Groth, P. Krüger, and J. Schmiedmayer, Appl. Phys. Lett. 88, 264103 (2006)APPLAB000088000026264103000001.

    H. Ott, J. Fortagh, G. Schlotterbeck, A. Grossmann, and C. Zimmermann, Phys. Rev. Lett. 87, 230401 (2001).

    S. Du, M. B. Squires, Y. Imai, L. Czaia, R. A. Saravanan, V. Bright, J. Reichel, T. W. Hänsch, and D. Z. Anderson, Phys. Rev. A 70, 053606 (2004).

    K. Dieckmann, R. J. C. Spreeuw, M. Weidemüller, and J. T. M. Walraven, Phys. Rev. A 58, 3891 (1998).


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