LOG IN or SELECT A PURCHASE OPTION:
Appl. Phys. Lett. 97, 171904 (2010); http://dx.doi.org/10.1063/1.3506498 (3 pages)
Mechanical response of GaN film and micropillar under nanoindentation and microcompression
(Received 7 August 2010; accepted 6 October 2010; published online 26 October 2010)
© 2010 American Institute of Physics
RELATED DATABASES
KEYWORDS and PACS
Keywords
bending, dislocations, gallium compounds, hardness, III-V semiconductors, internal stresses, micromechanics, nanoindentation, Raman spectra, semiconductor thin films, transmission electron microscopy, wide band gap semiconductors, yield stress, Young's modulus
PACS
-
III-V semiconductors
-
Fatigue, corrosion fatigue, embrittlement, cracking, fracture, and failure
-
Deformation, plasticity, and creep
-
Elasticity and anelasticity, stress-strain relations
-
III-V and II-VI semiconductors
-
Mechanical and acoustical properties
ARTICLE DATA
-
J. E. Bradby, S. O. Kucheyev, J. S. Williams, J. Wong-Leung, M. V. Swain, P. Munroe, G. Li, and M. R. Phillips, Appl. Phys. Lett. 80, 383 (2002)APPLAB000080000003000383000001.
C. J. Lee, J. C. Huang, and T. G. Nieh, Appl. Phys. Lett. 91, 161913 (2007)APPLAB000091000016161913000001.
M. Giehler, M. Ramsteiner, P. Waltereit, O. Brandt, H. Obloh, and K. H. Ploog, J. Appl. Phys. 89, 3634 (2001)JAPIAU000089000007003634000001.
C. A. Arguello, D. L. Rousseau, and S. P. S. Porto, Phys. Rev. 181, 1351 (1969).
P. Puech, F. Demangeot, J. Frandon, C. Pinquier, M. Kuball, V. Domnich, and Y. Gogotsi, J. Appl. Phys. 96, 2853 (2004)JAPIAU000096000005002853000001.
A. R. Goñi, H. Siegle, K. Syassen, C. Thomsen, and J. -M. Wagner, Phys. Rev. B 64, 035205 (2001).
For access to citing articles, you need to log in.
Access to article objects (figures, tables, multimedia) requires a subscription; log in to view available files.
(Access to supplementary files, where available, is free for this journal.)
Access to article objects (figures, tables, multimedia) requires a subscription; log in to view available files.
(Access to supplementary files, where available, is free for this journal.)

















This Publication
Scitation
SPIN
Google Scholar
PubMed